Local Characterization of Ferromagnetic Resonance in Bulk and Patterned Magnetic Materials Using Scanning Microwave Microscopy

Abstract

We have demonstrated the capabilities of the scanning microwave microscopy (SMM) technique for measuring ferromagnetic resonance (FMR) spectra in nanometric areas of magnetic samples. The technique is evaluated using three different samples, including an yttrium iron garnet (YIG) polycrystalline bulk sample and a thick YIG film grown by liquid phase epitaxy (LPE). Patterned permalloy (Py) micro-magnetic dots have been characterized to assess the performance for imaging applications of the technique, measuring the variation of the magnetic properties of the sample along its surface. The proposed technique may pave the way for the development of high spatially resolved mapping of magnetostatic modes in different nano and micro magnetic structures.

Fabrication of Ultra-Sharp Tips by Dynamic Chemical Etching Process for Scanning Near-Field Microwave Microscopy

“…Scanning near-field microwave microscopy (SNMM) is one of the types of scanning probe microscopy that facilitates nanometric characterization of materials in terms of electrical properties at a microwave frequency range where these materials are used to be operated widely in nanoscale devices. This makes SNMM appealing to a broad range of applications in measuring electrical quantities for different materials such as dielectric [ 6 ], semiconductors [ 7 , 8 ], 2D materials [ 9 , 10 ], ferroelectric [ 11 , 12 ], ferromagnetic [ 13 ], polymer composite materials [ 14 ] and even biological systems [ 15 , 16 , 17 ]. Another advantage of using microwaves lies in their ability to penetrate through dielectric and low conductive materials and see the subsurface characteristics in a non-destructive way [ 18 , 19 ].…”