“…Among them, we can cite nanoscale capacitance microscopy [1][2][3], electrostatic force microscopy (EFM) [4][5][6][7][8][9][10], nanoscale impedance microscopy [11,12], scanning polarization force microscopy [13][14][15][16], scanning microwave microscopy (SMM) [17,18] and nanoscale non-linear dielectric microscopy [19]. These techniques have allowed measuring the electric permittivity with nanoscale spatial resolution on planar samples, such as thin oxides, polymer films and supported biomembranes [2][3][4]8,10], and on non-planar ones, such as, single carbon nanotubes, nanowires, nanoparticles, viruses and bacterial cells [20][21][22][23][24][25][26][27][28][29][30].…”