2001
DOI: 10.1103/physrevb.63.060409
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Local manipulation and reversal of the exchange bias field by ion irradiation in FeNi/FeMn double layers

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Cited by 144 publications
(111 citation statements)
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“…2a, full symbols), consistent with previous work [16]. A discussion of the exchange bias field evolution with ion fluence is given in Ref.…”
supporting
confidence: 71%
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“…2a, full symbols), consistent with previous work [16]. A discussion of the exchange bias field evolution with ion fluence is given in Ref.…”
supporting
confidence: 71%
“…A discussion of the exchange bias field evolution with ion fluence is given in Ref. [16]. Based upon the latter and ion stopping calculations [17] we note that the interface roughness is not affected when ion fluences are below a few times 10 16 ions/cm 2 .…”
mentioning
confidence: 99%
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“…2,[6][7][8][9] In addition, dilution and irradiation experiments have shown that the number of defects in the antiferromagnetic layer also influences the domain structure and the exchange bias effect. [20][21][22][23] Since the magnitude of the exchange bias field is directly proportional to the pinned uncompensated moment along the bias direction, magneticfield annealing can change the bias field by modifying the number of pinned spins or realigning the orientation of the spin moment. Thermally activated diffusion changes the number of defects in the IrMn bulk and at CoFe/ IrMn interface during annealing at elevated temperatures.…”
Section: -3mentioning
confidence: 99%
“…In the case of ferromagnetic/antiferromagnetic (FM/AFM) exchange-biased bilayers, the exchange bias is sensitive to the interface and the AFM anisotropic energy. Accordingly, ion irradiation has been used to change both the magnitude and direction of the exchange field [9]. The exchange field can be either enhanced by the creation of defects, acting as domain-wall pinning sites, or can be suppressed to zero by the intermixing.…”
Section: Introductionmentioning
confidence: 99%