Local mechanical spectroscopy with nanometer-scale lateral resolution

Oulevey, F.; Gremaud, G.; Sémoroz, A.; Kulik, A.; Burnham, Nancy A.; Dupas, E.; Gourdon, Delphine

doi:10.1063/1.1148903

Cited by 49 publications

(28 citation statements)

References 19 publications

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“…Most of these techniques utilize displacement modulation, where either the tip holder or sample is oscillated, and the tip-sample response ͑amplitude or phase shift͒ used to provide an image. [11][12][13][14][15][16][17] In these techniques, the tip can be either in continuous or intermittent contact with the sample.…”

Section: Introductionmentioning

confidence: 99%

Quantitative imaging of nanoscale mechanical properties using hybrid nanoindentation and force modulation

Asif

Wahl

Colton

et al. 2001

Journal of Applied Physics

238

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In this article, we present a quantitative stiffness imaging technique and demonstrate its use to directly map the dynamic mechanical properties of materials with nanometer-scale lateral resolution. For the experiments, we use a ''hybrid'' nanoindenter, coupling depth-sensing nanoindentation with scanning probe imaging capabilities. Force modulation electronics have been added, enhancing instrument sensitivity and enabling measurements of time dependent materials properties ͑e.g., loss modulus and damping coefficient͒ not readily obtained with quasi-static indentation techniques. Tip-sample interaction stiffness images are acquired by superimposing a sinusoidal force ͑ϳ1 N͒ onto the quasi-static imaging force ͑1.5-2 N͒, and recording the displacement amplitude and phase as the surface is scanned. Combining a dynamic model of the indenter ͑having known mass, damping coefficient, spring stiffness, resonance frequency, and modulation frequency͒ with the response of the tip-surface interaction, creates maps of complex stiffness. We demonstrate the use of this approach to obtain quantitative storage and loss stiffness images of a fiber-epoxy composite, as well as directly determine the loss and storage moduli from the images using Hertzian contact mechanics. Moduli differences as small as 20% were resolved in the images at loads two orders of magnitude lower than with indentation, and were consistent with measurements made using conventional quasi-static depth-sensing indentation techniques.

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Section: Introductionmentioning

confidence: 99%

Quantitative imaging of nanoscale mechanical properties using hybrid nanoindentation and force modulation

Asif

Wahl

Colton

et al. 2001

Journal of Applied Physics

238

View full text Add to dashboard Cite

show abstract

“…Besides the work of Yuya et al [19], it has been suggested to exploit the Q-value of AFM contact-resonances to perform local internal friction measurements, for example in polymers and relate them to the various relaxation mechanisms, both locally and globally [35]. Similarly, Q-mapping of the contact-resonances of AFM cantilevers has been suggested to image areas of high absorption [36] in materials.…”

Section: Discussionmentioning

confidence: 97%

Observation of local internal friction and plasticity onset in nanocrystalline nickel by atomic force acoustic microscopy

Caron

Arnold

2009

Acta Materialia

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“…However, the electrochemical strains can be potentially used as the basis for been introduced, in which the SPM probe acts as a highly localized heating element with a low thermal mass (allowing heatingcooling-rates of the order of 10 5 K s − 1 ). Scanning thermal expansion microscopy (SThEM) [ 109 ] and thermally assisted atomic force acoustic microscopy (TA-AFAM) [ 110 ] are two scanning probe techniques, which allow studies of the mechanical properties of the materials as a function of temperature as well as studies of phase transitions with sub-100 nm spatial resolution. In both methods parameters of tip-surface contact resonance as a function of temperature are determined by bringing heated probe in contact with the sample surface.…”

Section: Electromechanical Probesmentioning

confidence: 99%

Local Electrochemical Functionality in Energy Storage Materials and Devices by Scanning Probe Microscopies: Status and Perspectives

Kalinin

Balke

2010

Advanced Materials

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Energy storage and conversion systems are an integral component of emerging green technologies, including mobile electronic devices, automotive, and storage components of solar and wind energy economics. Despite the rapidly expanding manufacturing capabilities and wealth of phenomenological information on the macroscopic device behaviors, the microscopic mechanisms underpinning battery and fuel cell operations in the nanometer-micrometer range are virtually unknown. This lack of information is due to the dearth of experimental techniques capable of addressing elementary mechanisms involved in battery operation, including electronic and ion transport, vacancy injection, and interfacial reactions, on the nanometer scale. In this article, a brief overview of scanning probe microscopy (SPM) methods addressing nanoscale electrochemical functionalities is provided and compared with macroscopic electrochemical methods. Future applications of emergent SPM methods, including near field optical, electromechanical, microwave, and thermal probes and combined SPM-(S)TEM (scanning transmission electron microscopy) methods in energy storage and conversion materials are discussed.

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Local mechanical spectroscopy with nanometer-scale lateral resolution

Abstract: High speed wafer scale bulge testing for the determination of thin film mechanical properties Rev. Sci. Instrum. 81, 055111 (2010);

Cited by 49 publications

References 19 publications

Quantitative imaging of nanoscale mechanical properties using hybrid nanoindentation and force modulation

Quantitative imaging of nanoscale mechanical properties using hybrid nanoindentation and force modulation

Observation of local internal friction and plasticity onset in nanocrystalline nickel by atomic force acoustic microscopy

Local Electrochemical Functionality in Energy Storage Materials and Devices by Scanning Probe Microscopies: Status and Perspectives

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