Local Sensitivity Analysis and Monte Carlo Simulation to Examine the Effects of Chipless RFID Measurement Uncertainties—Part II: Consideration of Multiple Measurement Uncertainties

Abstract

Measurement and response decoding is an ongoing challenge in the chipless radio frequency identification (RFID) field. Measurement uncertainties, including tag/reader misalignment, S-parameter error, and clutter, can cause response distortions, such as magnitude changes and resonant frequency shifts, that can lead to the improper assignment of a binary code or sensing parameter (i.e., decoding). This work aims to use local sensitivity analysis and Monte Carlo simulation to fully characterize the effects of misalignment, response parameter measurement error (e.g., VNA S-parameter error), and clutter on chipless RFID responses that are measured in the near-field with a monostatic setup. From this type of comprehensive characterization, conclusions are drawn about the identification (ID) and sensing capabilities of the tags. While the effect of misalignment-based uncertainty was examined in Part I, here in Part II S11 uncertainty and clutter-based uncertainty are examined both individually and in combination with misalignment-based uncertainty. An example, demonstrating the application of the proposed tag performance assessment framework is also provided.