2016
DOI: 10.1016/j.jallcom.2016.04.184
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Local shear stress-strain response of Sn-3.5Ag/Cu solder joint with high fraction of intermetallic compounds: Experimental analysis

Abstract: Current trend in miniaturization of microelectronic devices is the motivating factor for size reduction of joints and interconnects. The electronic industry is expecting to reduce the scale of interconnects in the next generations microelectronic devices. Mechanical behavior of these joints will significantly be different from traditional solder joints due to the effects such as geometrical and microstructural constraints, anisotropy caused by the reduction in a number of grains, and the presence of brittle in… Show more

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Cited by 53 publications
(19 citation statements)
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“…Table 1 lists the values of the time exponent n and the correlation factor R 2 for the interfacial IMCs. The n value is considered to be a pointer to the growth mechanism of interfacial IMCs [18,19]. If the n value is closer to 0.33, the IMC growth is dominated by grain-boundary diffusion.…”
Section: Growth Mechanism Of Interfacial Imcsmentioning
confidence: 99%
See 1 more Smart Citation
“…Table 1 lists the values of the time exponent n and the correlation factor R 2 for the interfacial IMCs. The n value is considered to be a pointer to the growth mechanism of interfacial IMCs [18,19]. If the n value is closer to 0.33, the IMC growth is dominated by grain-boundary diffusion.…”
Section: Growth Mechanism Of Interfacial Imcsmentioning
confidence: 99%
“…If the n value is closer to 0.33, the IMC growth is dominated by grain-boundary diffusion. If the n value is on the order of 0.5, the IMC growth is dominated by bulk diffusion [18,19]. The values of the time exponent n implied that the growth of the interfacial IMCs at the lead side was dominated by bulk diffusion, and the growth of the interfacial IMCs at the Ni-P layer side was dominated by grain-boundary diffusion under extreme temperature thermal shock.…”
Section: Growth Mechanism Of Interfacial Imcsmentioning
confidence: 99%
“…Lapisan ini terbentuk semasa tindak-balas pembasahan sewaktu proses pematerian dan tumbuh membesar dalam keadaan pepejal disebabkan oleh tindakan teraktif terma melalui proses resapan. Dalam kajian lepas, isu tentang pertumbuhan IMC merupakan isu yang sering menjadi perhatian (Choudhury & Ladani 2016). Lapisan IMC pada antaramuka pateri-substrat merupakan indikasi kebolehbasahan serta ikatan metalurgi bagi sambungan pateri yang baik.…”
Section: Pengenalanunclassified
“…eir research shows that the ultimate shear strength and strain to failure are largely dependent on the volume fraction of IMCs. In addition, the far-field or nominal shear strain is completely different than the local shear strain behavior at the solder joint region [19].…”
Section: Introductionmentioning
confidence: 99%