2012
DOI: 10.1021/la302565s
|View full text |Cite
|
Sign up to set email alerts
|

Local Thermomechanical Analysis of a Microphase-Separated Thin Lamellar PS-b-PEO Film

Abstract: We use atomic force microscopy (AFM) and hot tip AFM (HT-AFM) to thermophysically characterize a 30 nm thick film of poly(styrene-block-ethylene oxide), PS-b-PEO, and to modify its lamellar patterns having spacing of 39 ± 3 nm. AFM tip scans of the polymer film induce either abrasive surface patterns or nanoscale ripples, which depend upon the tip force, temperature, and number of scans. The evolution of the lamellar patterns is explained by the polymer film molecular structure and mode I crack propagation in … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

1
17
0

Year Published

2013
2013
2024
2024

Publication Types

Select...
7
1

Relationship

3
5

Authors

Journals

citations
Cited by 18 publications
(18 citation statements)
references
References 72 publications
1
17
0
Order By: Relevance
“…Finally, we have also observed the formation of ripples inside all spiral tracks, resulting from the stick-slip mechanism mentioned above [19]. An example is given in Fig.…”
Section: Resultssupporting
confidence: 52%
See 1 more Smart Citation
“…Finally, we have also observed the formation of ripples inside all spiral tracks, resulting from the stick-slip mechanism mentioned above [19]. An example is given in Fig.…”
Section: Resultssupporting
confidence: 52%
“…In order to interpret our results we first notice that stationary heat flow below by the cantilever reaches a critical value and the tip suddenly jumps in a stick-slip fashion [19].…”
Section: Resultsmentioning
confidence: 99%
“…For an overview on these and related processes, the reader is referred to a recent review by Li et al [4]. On the nanoscale, the formation of wavy ripple patterns on compliant surfaces has been frequently reported in atomic force microscopy (AFM) measurements in contact mode [5][6][7][8][9][10][11][12][13][14][15][16][17]. In this case, the ripple periodicity λ is found to be slightly larger than the size of the tip apex, and strongly influenced by external conditions such as normal force, scan velocity and temperature [13,[17][18][19], while none of the two aforementioned macroscopic processes has been observed.…”
Section: Introductionmentioning
confidence: 99%
“…Elkaakour et al assumed that the surface rippling of polymers is caused by a peeling process in which the material is pushed ahead of the contact by crack propagation [6]. This hypothesis was recently revisited by Rice et al [17], who ruled out the presence of peeling effects on copolymers locally heated and scraped by a dedicated 'hot tip' AFM. Filippov et al reproduced various ripple patterns on ionic crystals assuming that the substrate is removed atom-by-atom and randomly displaced aside at an angle depending on the tip shape [20].…”
Section: Introductionmentioning
confidence: 99%
“…Thermal stabilization of the polymers has been showed to occur at the time scales of less than 1 µs and AFM tip-polymer contact radii are of the order of only tens of nanometers below the T g [23]. At such conditions, plastic deformations and/or viscous matter flow do not affect the consecutive spiral windings.…”
Section: Resultsmentioning
confidence: 99%