Local triboelectrification of an n-GaAs surface using the tip of an atomic-force microscope

Brunkov, P. N.; Goncharov, V. V.; Rudinsky, M. E.; Gutkin, A. A.; Gordeev, N. Yu.; Lantratov, V. M.; Kalyuzhnyy, N. A.; Mintairov, S. A.; Sokolov, R. V.; Konnikov, S. G.

doi:10.1134/s1063782613090054

Cited by 8 publications

(10 citation statements)

References 16 publications

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“…All experiments showed significant changes in the surface potential due to charging. Similar results were obtained for thin semiconductor layers, i.e., for an n-doped GaAs film charged by rubbing with a Si AFM tip covered by Co/Cr [31]. The common observations are as follow: -the charged area is much larger than the expected contact area after static contact [22]; -both positively and negatively charged areas can be stored on the surface depending on the applied bias polarity during charging by rubbing [24, 28 -30]; -asymmetrical behavior of positively and negatively charged areas [24,30]; -the charges accumulate during consecutive charging events [24] and eventually reach a saturation level [23,24]; -loss of charge with time occurs [24].…”

Section: Introductionsupporting

confidence: 82%

“…Charging was performed under ambient conditions (20 -50 % r.H.) using contact forces between 2 nN -3.5 lN. Similar results were obtained for thin semiconductor layers, i.e., for an n-doped GaAs film charged by rubbing with a Si AFM tip covered by Co/Cr [31]. All experiments showed significant changes in the surface potential due to charging.…”

Section: Introductionsupporting

confidence: 54%

“…Both rubbing and static charging at the same location of the sample surface have been applied. This might indicate that the charges were partially trapped in stable trap states [24,31]. The KPFM signal was collected after each charging event.…”

Section: Resultsmentioning

confidence: 99%

“…The first component depends on the surface properties of the two materials, and the second is influenced by the bias and surface charges on the surface of the insulating sample [24]. However, Brunkov et al [31] concluded that the mechanical interaction between AFM tip and surface causes local deformation of atomic bonds in the near-surface region. Therefore, the measured lateral surface potential differences are mainly due to local charge transfer upon contact charging [24].…”

Section: Kelvin Probe Force Microscopymentioning

confidence: 99%

“…So far, the investigations [23 -30] on local triboelectrification and point contacts did not provide a full physical explanation. Contact charging is related to two aspects: firstly, the difference between the work functions of the materials of the probe and the surface, and secondly, the local electronic modification of the surface under study caused by the appearance/introduction of new electron surface states and the structural rearrangement of atoms in the surface near region (stress, material, and ion transport) [31]. Here, first results of contact charging of bulk calcite by rubbing and static charging using contact mode AFM are presented.…”

Section: Introductionmentioning

confidence: 99%

See 4 more Smart Citations

Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing

Mirkowska

Kratzer

Teichert

et al. 2014

Chemie Ingenieur Technik

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Electrification of insulators has been applied for years in the triboelectrostatic separation of minerals. However, the knowledge of the charge exchange during particle contact is still limited. Here, the electric charging of calcite single crystals upon contact with atomic force microscopy (AFM) probes was studied through different contact types. A combination of contactmode AFM and Kelvin probe force microscopy was employed to verify the local surface potentials before and after charging, and focused on the influence of contact time, load force, and applied bias on the charge transfer. a) b) Figure 6. KPFM measurements presenting the surface potential distribution for the calcite surface after repeated charging on an area of 4 × 4 lm 2 , wherein the AFM tip was pressed to the surface with a force of ∼3 lN and bias applied to the AFM tip was (a) -10 V and (b) +10 V. Corresponding curves of charge development and decay are also shown. Crosses (x) between KPFM images indicate charging events. The diagrams in the bottom show the evolution of surface potential with time: symbols D, ᮀ, and ᭜ represent maximum, minimum, and average values, respectively, of the surface potential collected from an area of 10 × 10 lm 2 .

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Section: Introductionsupporting

confidence: 82%

Section: Introductionsupporting

confidence: 54%

Section: Resultsmentioning

confidence: 99%

Section: Kelvin Probe Force Microscopymentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing

Mirkowska

Kratzer

Teichert

et al. 2014

Chemie Ingenieur Technik

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Principal Factors of Contact Charging of Minerals for a Successful Triboelectrostatic Separation Process – a Review

Mirkowska

Kratzer

Teichert

et al. 2016

Berg Huettenmaenn Monatsh

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Triboelectrostatic separation is a promising method used to separate non-conductive minerals. However, the knowledge about the underlying triboelectrification mechanisms is still very limited. Thus, predicting the separation results and finding proper separation parameters are challenging tasks. This article presents a comprehensive summary of phenomena and factors which play a decisive role in the charging behavior of non-conductors and, by implication, the efficiency of the separation process, such as water and adsorbents layers on the surface, surface roughness, humidity, type of contact, etc. The authors hope that this article opens a way for a systematic approach through basic experiments dedicated to a better understanding of triboelectrification processes.

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Molecular dynamics simulations of GaAs-crystal surface modifications during nanoindentation with AFM tip.

Prasolov

Brunkov

Gutkin

2017

J. Phys.: Conf. Ser.

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Local triboelectrification of an n-GaAs surface using the tip of an atomic-force microscope

Cited by 8 publications

References 16 publications

Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing

Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing

Principal Factors of Contact Charging of Minerals for a Successful Triboelectrostatic Separation Process – a Review

Molecular dynamics simulations of GaAs-crystal surface modifications during nanoindentation with AFM tip.

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