Localized picosecond resolution with a near-field microwave/scanning-force microscope

Weide, Daniel W. van der

doi:10.1063/1.118272

Cited by 40 publications

(18 citation statements)

References 18 publications

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“…We present a detailed design of our sensor built onto an AFM cantilever by standard micro-fabrication processes, taking advantage of a well developed platform [15,16] that provides the scanning and distance control functions. Fig.…”

Section: A Sensor Designmentioning

confidence: 99%

Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Lai

Leindecker

et al. 2007

Review of Scientific Instruments

110

109

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We present the design and experimental results of a near-field scanning microwave microscope (NSMM) working at a frequency of 1GHz. Our microscope is unique in that the sensing probe is separated from the excitation electrode to significantly suppress the common-mode signal. Coplanar waveguides were patterned onto a silicon nitride cantilever interchangeable with atomic force microscope (AFM) tips, which are robust for high speed scanning. In the contact mode that we are currently using, the numerical analysis shows that contrast comes from both the variation in local dielectric properties and the sample topography. Our microscope demonstrates the ability to achieve high resolution microwave images on buried structures, as well as nano-particles, nano-wires, and biological samples.1

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Section: A Sensor Designmentioning

confidence: 99%

Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Lai

Leindecker

et al. 2007

Review of Scientific Instruments

110

109

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show abstract

“…Wave-guide type designs for the microfabricated tips are necessary. Their feasibility was demonstrated by van der Weide (1997). For the present status of tips available today, only experiments in the low-frequency range of the spectrum can be performed routinely.…”

Section: Dependence Of the Electrostatic Force On Distancementioning

confidence: 99%

Scanning Polarization Force Microscopy: a Technique for Studies of Wetting Phenomena At the Nanometer Scale

Salmerón

2001

Oil & Gas Science and Technology - Rev. IFP

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Résumé -Microscope atomique à polarisation : une technique pour étudier les phénomènes de mouillage à l'échelle nanométrique -Nous décrivons une technique, développée récemment et basée sur la mesure de forces électrostatiques à l'aide d'un microscope à force atomique, pour étudier les films liquides et les gouttes. Cette technique, dénommée microscopie atomique à polarisation, est une véritable technique sans contact où la pointe du microscope parcourt la surface à une distance de quelques centaines d'angströms, ce qui est suffisant pour minimiser les perturbations du film liquide. La résolution est de l'ordre d'une centaine d'angströms horizontalement et d'un angström verticalement. L'information fournie par ce microscope comprend la topographie, le potentiel de contact et une cartographie diélectrique de l'échantillon (fonction de la fréquence utilisée). Après une brève description des concepts de base du mouillage, nous décrivons cette nouvelle technique et illustrons, à travers quelques exemples, quelques-unes de ses applications potentielles.Mots-clés : mouillage, pression de disjonction, microscope atomique, propriétés diélectriques. Abstract -Scanning Polarization Force Microscopy: A Technique for Studies of Wetting Phenomena at the Nanometer Scale -We describe a technique developed recently based on the use of electrostatic forces in the atomic force microscope (AFM) to image liquid films and droplets. The technique, named scanning polarization force microscopy (SPFM), is a truly non-contact

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“…Initial probes from our group 169 were made by coating a commercial silicon SFM probe with photoresist and gold, then opening the coaxial structure by rubbing the tip gently on a substrate while in feedback ͑Fig. 9͒.…”

Section: Coaxial Tips Integrated With Scanning Force Microscopymentioning

confidence: 99%

High-frequency near-field microscopy

Rosner

Weide

2002

Review of Scientific Instruments

219

133

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Conventional optics in the radio frequency ͑rf͒ through far-infrared ͑FIR͒ regime cannot resolve microscopic features since resolution in the far field is limited by wavelength. With the advent of near-field microscopy, rf and FIR microscopy have gained more attention because of their many applications including material characterization and integrated circuit testing. We provide a brief historical review of how near-field microscopy has developed, including a review of visible and infrared near-field microscopy in the context of our main theme, the principles and applications of near-field microscopy using millimeter to micrometer electromagnetic waves. We discuss and compare aspects of the remarkably wide range of different near-field techniques, which range from scattering type to aperture to waveguide structures.

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Localized picosecond resolution with a near-field microwave/scanning-force microscope

Abstract: Reflection scanning near-field optical microscopy with uncoated fiber tips: How good is the resolution really?

Cited by 40 publications

References 18 publications

Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Atomic-force-microscope-compatible near-field scanning microwave microscope with separated excitation and sensing probes

Scanning Polarization Force Microscopy: a Technique for Studies of Wetting Phenomena At the Nanometer Scale

High-frequency near-field microscopy

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