Localizing Defects on Circuits Using High-Resolution OFT

Blanca, Carlo Mar; Cemine, Vernon Julius; Buenaobra, Bernardino; Saloma, Caesar

doi:10.1364/opn.17.12.000030

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Cited by 4 publications

(2 citation statements)

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“…Considering the SMI effect, the laser frequency υ 0 will be modified as 5 E Q -T A R G E T ; t e m p : i n t r a l i n k -; e 0 0 3 ; 6 3 ; 2 9…”

Section: Theoretical Modelingmentioning

confidence: 99%

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Measurement of microsurface topography using a self-mixing optical configuration

et al. 2018

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This work proposes to measure the topography of microstructure surfaces using a self-mixing interference (SMI) configuration. The theoretical measurement model is built using beam-expanded plane wave method and considering SMI effect. The interference patterns for different objects are obtained based on the presented model. In addition, an algorithm for reconstructing the three-dimensional surface is implemented and applied onto an object with spherical surface. The presented work shows the potential application for topography measurement using a compact SMI configuration.

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“…Considering the SMI effect, the laser frequency υ 0 will be modified as 5 E Q -T A R G E T ; t e m p : i n t r a l i n k -; e 0 0 3 ; 6 3 ; 2 9…”

Section: Theoretical Modelingmentioning

confidence: 99%

“…[2][3][4][5] The SMI-based imaging can be classified into two classes. In one class, the LD is set to operate at a steady state, [6][7][8][9] using SMI in a confocal microscope configuration. The laser is operated at a constant bias current.…”

Section: Introductionmentioning

confidence: 99%