2014
DOI: 10.1109/jlt.2014.2324018
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Locally Erasable Couplers for Optical Device Testing in Silicon on Insulator

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Cited by 27 publications
(17 citation statements)
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“…An ion energy and fluence of 130 KeV and 1×10 15 ions/cm 2 were used, respectively. According to our previously results [1], [2], this will provide 80% lattice disorder in silicon with a refractive index change of 0.5. The refractive index profile was measured using ellipsometry on a bulk implanted substrate, at 6 different angles of incidence as described in detail in Ref.…”
Section: Design and Fabricationmentioning
confidence: 61%
“…An ion energy and fluence of 130 KeV and 1×10 15 ions/cm 2 were used, respectively. According to our previously results [1], [2], this will provide 80% lattice disorder in silicon with a refractive index change of 0.5. The refractive index profile was measured using ellipsometry on a bulk implanted substrate, at 6 different angles of incidence as described in detail in Ref.…”
Section: Design and Fabricationmentioning
confidence: 61%
“…After fabrication of gratings and devices, a 20 nm Then an e-beam resist layer was deposited as mask layer for the Ge implantation. According to our previous results [6], over 80% lattice disorder in silicon would give a refractive index change of 0.5. Ge implantation was performed with energy of 130KeV and a dose of 1×10 15 ions/cm 2 .…”
Section: Device Design and Laser Annealingmentioning
confidence: 59%
“…Surface GCs are a fundamental waveguide device for bridging huge mode mismatch between those in a PIC and a single-mode fiber (SMF) [72]. GCs can be designed at any position of a chip and may even be erasable [73] using postfabrication trimming technology [74,75]. With a large alignment tolerance, they provide a robust solution in optical interconnection [76,77].…”
Section: Subwavelength-structured Surface Grating Couplersmentioning
confidence: 99%