2014
DOI: 10.1007/s00542-014-2285-6
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Locally resolved stress and strain analysis of sinter-joined micro valves using synchrotron X-ray diffraction and conical slit apertures

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Cited by 2 publications
(3 citation statements)
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“…Considering these conditions, the residual stress gradient in the thickness direction can be evaluated with a depth resolution in the submillimeter range, e.g., realized by using a conical slit cell mounted between the sample and the detector. [49] To validate the applied method, in situ tensile tests were performed to investigate the stability of the experimentally determined strain distribution. Finally, based on the novel approach detailed, the local variation of residual stresses as a function of sample position and the influence of processing parameters were investigated for LPBF IN718.…”
Section: Challenges For Diffraction Experimentsmentioning
confidence: 99%
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“…Considering these conditions, the residual stress gradient in the thickness direction can be evaluated with a depth resolution in the submillimeter range, e.g., realized by using a conical slit cell mounted between the sample and the detector. [49] To validate the applied method, in situ tensile tests were performed to investigate the stability of the experimentally determined strain distribution. Finally, based on the novel approach detailed, the local variation of residual stresses as a function of sample position and the influence of processing parameters were investigated for LPBF IN718.…”
Section: Challenges For Diffraction Experimentsmentioning
confidence: 99%
“…Considering these conditions, the residual stress gradient in the thickness direction can be evaluated with a depth resolution in the submillimeter range, e.g., realized by using a conical slit cell mounted between the sample and the detector. [ 49 ]…”
Section: Introductionmentioning
confidence: 99%
“…Given that the number of illuminated grains is potentially a controlling consideration for achieving satisfactory lattice strain measurement precision, it is important to understand the associated geometry of the gauge volume, V, and the grain size, D, of the material to be studied. In the monochromatic diffraction experiments covered in this work, depth resolved measurements were not made, which is to say the outgoing beam was not defined (e.g., with the conical slit system) [27]. As such, the gauge length is simply the thickness of the part being measured, z, with the remaining gauge dimensions being defined by the slit size h 1 × h 2 , where in most cases h = h 1 = h 2 , such that V = zh 2 .…”
Section: Measurement Gauge Volume and Illuminated Grainsmentioning
confidence: 99%