Logarithmic decrease of adhesion force with lateral dynamic revealed by an AFM cantilever at different humidities

Lai, Tianmao; Meng, Yonggang; Zhan, Wanglong; Huang, Ping

doi:10.1080/00218464.2016.1278532

Cited by 12 publications

(7 citation statements)

References 31 publications

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“…Experimentally, an atomic force microscope is a versatile equipment in surface analysis and is commonly used in the measurement of adhesion forces. − On an atomic force microscope, the force can be measured with a high resolution and in various conditions. Many factors influence the adhesion force measurement on an atomic force microscope: surface hydrophobicity, roughness, relative humidity (RH), temperature, and so forth. , In addition, several atomic force microscopy (AFM) measurement parameters can also affect the results: loading force, contact time, piezo velocity, lateral velocity, and so forth. − The influence of these factors and parameters is important to better understand the adhesion mechanisms and behaviors.…”

Section: Introductionmentioning

confidence: 99%

Different Evolution Behaviors of Adhesion Force with Relative Humidity at Silica/Silica and Silica/Graphene Interfaces Studied using Atomic Force Microscopy

et al. 2021

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The influence of relative humidity (RH) on adhesion forces demands clarification. Adhesion forces at silica/silica and silica/graphene interfaces were measured on an atomic force microscope to investigate the evolution behaviors with RH and the contact time dependence at a certain RH. For the silica/silica interface, the adhesion force at a location by decreasing RH is independent of RH, but increases as a whole with RH both at a location and in the force volume mode by increasing RH. However, for the silica/graphene interface at a location, the adhesion force remains unchanged with RH as a whole by reducing RH and tends to decrease as a whole by increasing RH. In the force volume mode, the adhesion force at the silica/graphene interface is independent of RH. For the silica/silica interface, the adhesion force increases logarithmically with dwell time at a low RH and remains unchanged at a high RH. However, for the silica/graphene interface, the force is not dependent on RH at low and high RHs. The results can serve to further understand the mechanisms and behaviors of adhesion forces and promote the anti-adhesion design for small-scale silicon-based structures.

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Section: Introductionmentioning

confidence: 99%

Different Evolution Behaviors of Adhesion Force with Relative Humidity at Silica/Silica and Silica/Graphene Interfaces Studied using Atomic Force Microscopy

et al. 2021

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“…For the same ionic concentration of the aqueous solution above, the velocity u 0 100 µm/s is obtained. Velocities of order 100 µm/s are accessible in experiments and have been used in colloidal-probe AFM measurements [33][34][35] as the relative velocity between probe and object.…”

Section: Summary and Discussionmentioning

confidence: 99%

Linear response functions of an electrolyte solution in a uniform flow

et al. 2018

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We study the steady state response of a dilute monovalent electrolyte solution to an external source with a constant relative velocity with respect to the fluid. The source is taken as a combination of three perturbations: an external force acting on the fluid, an externally imposed ionic chemical potential, and an external charge density. The linear response functions are obtained analytically and can be decoupled into three independent terms, corresponding to (i) fluid flow and pressure, (ii) total ionic number density and current, and (iii) charge density, electrostatic potential and electric current. It is shown how the uniform flow breaks the equilibrium radial symmetry of the response functions, leading to a distortion of the ionic cloud and electrostatic potential, which deviate from the standard Debye-Hückel result. The potential of a moving charge is under-screened in its direction of motion and over-screened in the opposite direction and normal plane. As a result, an unscreened dipolar electric field and electric currents are induced far from the charged source. We relate our general formalism to several experimental setups, such as colloidal sedimentation .

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“…On a microscale, a decrease has also been reported and was attributed to the breakage of adhesive junctions [ 13 ]. Recently, Lai et al [ 14 , 15 ] found that with the increase of lateral velocity, adhesion force decreases logarithmically at large velocities in air. This decrease was attributed to the increase in size of water bridges with contact time formed in the contact zone.…”

Section: Introductionmentioning

confidence: 99%

Influence of Lateral Movement on Level Behavior of Adhesion Force Measured Repeatedly by an Atomic Force Microscope (AFM) Colloid Probe in Dry Conditions

Lai

2021

Materials

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An atomic force microscope (AFM) was operated to repeatedly measure the adhesion forces between a polystyrene colloid probe and a gold film, with and without lateral movement in dry conditions. Experimental results show that the adhesion force shows a level behavior without lateral movement and with a small scan distance: the data points are grouped into several levels, and the adhesion force jumps between different levels frequently. This was attributed to the fact that when the cantilever pulls off the sample, the contact area of the sample is not exactly the same between successive contacts and jumps randomly from one to another. Both lateral velocity and material wear have little influence on level behavior. However, with a medium scan distance, level behavior is observed only for some measurements, and adhesion forces are randomly distributed for the other measurements. With a large scan distance, adhesion forces are randomly distributed for all measurements. This was attributed to the fact that the cantilever pulls off the sample in many different contact areas on the scanning path for large distances. These results may help understand the influence of lateral movement and imply the contribution of asperities to adhesion force.

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Logarithmic decrease of adhesion force with lateral dynamic revealed by an AFM cantilever at different humidities

Cited by 12 publications

References 31 publications

Different Evolution Behaviors of Adhesion Force with Relative Humidity at Silica/Silica and Silica/Graphene Interfaces Studied using Atomic Force Microscopy

Different Evolution Behaviors of Adhesion Force with Relative Humidity at Silica/Silica and Silica/Graphene Interfaces Studied using Atomic Force Microscopy

Linear response functions of an electrolyte solution in a uniform flow

Influence of Lateral Movement on Level Behavior of Adhesion Force Measured Repeatedly by an Atomic Force Microscope (AFM) Colloid Probe in Dry Conditions

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