2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2022
DOI: 10.1109/ipfa55383.2022.9915713
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Logo Detection and Localization for IC Authentication, Marking Recognition, and Counterfeit Detection

Mukhil Azhagan Mallaiyan Sathiaseelan
1
,
Manoj Yasaswi Vutukuru
2
,
Shajib Ghosh
3
et al.
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