“…van Hove et al, 2009; Vatsa et al, 2008), serial focused ion beam and serial block‐face scanning electron microscopy (e.g. Schneider, Meier,Wepf, & Müller, 2010), ptychographic X‐ray computed tomography (Dierolf et al, 2010) and X‐ray synchrotron micro‐computed tomography (SRµCT) or nanotomography (Currey & Shahar, 2013; Dong et al, 2014; Kamska et al, 2019; Mader, Schneider, Müller, & Stampanoni, 2013; O’Shea, Keating, & Donoghue, 2019; Ofer et al, 2019; Pacureanu, Langer, Boller, Tafforeau, & Peyrin, 2012; Peyrin, Dong, Pacureanu, & Langer, 2014; Sanchez et al, 2013, 2014; Sanchez, Tafforeau, Clack, & Ahlberg, 2016; Schneider et al, 2007; Suniaga et al, 2018), each method bringing comparative advantages and shortcomings (Goggin, Zygalakis, Oreffo, & Schneider, 2016; Sanchez, Ahlberg, Trinajstic, Mirone, & Tafforeau, 2012; Webster et al, 2013).…”