2023
DOI: 10.1002/adfm.202303641
|View full text |Cite
|
Sign up to set email alerts
|

Long Duration Persistent Photocurrent in 3 nm Thin Doped Indium Oxide for Integrated Light Sensing and In‐Sensor Neuromorphic Computation

Abstract: Miniaturization and energy consumption by computational systems remain major challenges to address. Optoelectronics based synaptic and light sensing provide an exciting platform for neuromorphic processing and vision applications offering several advantages. It is highly desirable to achieve single‐element image sensors that allow reception of information and execution of in‐memory computing processes while maintaining memory for much longer durations without the need for frequent electrical or optical rehears… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

1
11
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 20 publications
(12 citation statements)
references
References 47 publications
1
11
0
Order By: Relevance
“…X-ray photoelectron spectroscopy (XPS) is used to determine the chemical composition of the printed In 2 O 3 nanosheets as depicted in Figure e–g. The XPS analysis shows the In 3+ oxidation peaks of In 2 O 3 at 444.2 eV and 452 eV and the presence of oxygen peaks at 529.9 eV, which is in accordance with that of c- In 2 O 3 reported in the literature . The remaining oxygen peaks observed in the XPS analysis can be attributed to organic contaminants or the oxygen from the Si/SiO 2 substrate …”
Section: Resultssupporting
confidence: 88%
See 3 more Smart Citations
“…X-ray photoelectron spectroscopy (XPS) is used to determine the chemical composition of the printed In 2 O 3 nanosheets as depicted in Figure e–g. The XPS analysis shows the In 3+ oxidation peaks of In 2 O 3 at 444.2 eV and 452 eV and the presence of oxygen peaks at 529.9 eV, which is in accordance with that of c- In 2 O 3 reported in the literature . The remaining oxygen peaks observed in the XPS analysis can be attributed to organic contaminants or the oxygen from the Si/SiO 2 substrate …”
Section: Resultssupporting
confidence: 88%
“…As shown in Figure b, the device shows approximately 2 orders of magnitude change in current upon illumination with a slow decaying photocurrent upon stimulus removal. The persistent photocurrent (PPC) characteristics observed in the device arises from the presence of defects from oxygen vacancies (V o ) and atomic-scale thickness. , The photoresponse of the material in the visible spectrum can be attributed to the postsynthesis annealing process, which improves the material carrier mobility and possibly allows for new V o -based energy levels for easy electronic transitions with lesser energy between the valence band (VB) and conduction band (CB). , As reported previously, the improved UV photodetection and carrier mobility in LM-printed In 2 O 3 have been associated with reduced grain boundaries and lower recombination rate arising from the annealing process . With increasing grain sizes due to annealing, there is a reduction in the intergranular distorted region in the polycrystalline sheet, resulting in improved mobility due to fewer barriers .…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…Although amorphous In 2 O 3 films have been widely studied in electrical devices, their photodetection performance is rarely reported due to the famous persistent photocurrent (PPC) phenomenon. ,, The PPC phenomenon originates from the ionized oxygen vacancies and is prevalent in oxide semiconductors, which prevents the recombination of photogenerated carriers after removing the light signal, resulting in a slow photoresponse speed and unstable dynamic photoresponse. , On the other hand, it is well-known that the In cation is a creator of oxygen vacancy (Vo) due to the weak In–O bond strength, and Vo acts as an electron source site . Hence, the electron concentration in amorphous films is high, resulting in a large dark current and a small I light / I dark ratio in photodetectors.…”
Section: Introductionmentioning
confidence: 99%