Long-Term Exposure of Graphene Oxide Suspension to Air Leading to Spontaneous Radical-Driven Degradation

Sluggish and Ion-Resilient Behavior of Interfacial Aqueous Layer on Single-Layer Graphene Oxide: Insights from In Situ Atomic Force Microscopy

“…The Raman results unveiled an I D / I G ratio of approximately 1.0 (Figure S1). As inferred from the XPS data (Figure S2), the C/O ratio was calculated to be 2.24, which is almost identical to the result in our previous work . To scrutinize the existence of interfacial aqueous layers within the GO in ambient air, we harnessed PeakForce-Tapping-mode AFM to map and analyze the height profile of the GO surface.…”

“…As inferred from the XPS data (Figure S2), the C/O ratio was calculated to be 2.24, which is almost identical to the result in our previous work. 30 To scrutinize the existence of interfacial aqueous layers within the GO in ambient air, we harnessed PeakForce-Tappingmode AFM to map and analyze the height profile of the GO surface. PeakForce Tapping mode in AFM is a technique that employs a low interaction force between the AFM tip and the sample, providing high-speed imaging and quantitative mapping of material properties while minimizing sample damage.…”

“…The thickness of single-layer GO was consistent with those reported in most papers. 26,30 The folded bilayer region was measured at 1.59 nm. This signifies that the height of the upper layer measures 0.68 nm, marking a difference of 0.23 nm in comparison to the bottom layer's height.…”