2016 IEEE Electrical Insulation Conference (EIC) 2016
DOI: 10.1109/eic.2016.7548643
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Long term testing and analysis of dielectric samples under DC excitation

Abstract: This paper details testing conducted under DC conditions on a dielectric sample containing internal voids. The DC testing was conducted using a ramp method to vary the voltage applied to the dielectric sample. The dielectric sample was de-energised for a week prior to two separate identical ramp tests and the results are presented showing the variability of PD activity. After the second ramp test an additional ramp test was performed in quick succession and PD activity was reduced, emphasizing the importance o… Show more

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Cited by 5 publications
(6 citation statements)
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“…The characteristic peak on the left hand side of the histograms remained throughout the three ramp tests and actually was accentuated by prior application of the negative ramp test before the final positive ramp test. In previous work it was found that this characteristic peak reduced when exposed to repeated positive DC ramp tests [8].…”
Section: B DC Test Resultsmentioning
confidence: 84%
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“…The characteristic peak on the left hand side of the histograms remained throughout the three ramp tests and actually was accentuated by prior application of the negative ramp test before the final positive ramp test. In previous work it was found that this characteristic peak reduced when exposed to repeated positive DC ramp tests [8].…”
Section: B DC Test Resultsmentioning
confidence: 84%
“…In contrast when subsequent positive ramp tests were performed in quick succession in previous work [8] the number of PD events reduced. The negative ramp test allowed the dielectric sample to be re-initialised.…”
Section: Discussionmentioning
confidence: 81%
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“…In general, PD is defined in AC voltage system. However, recently, PD in DC system was also introduced [26][27][28][29]. Time derivative of the applied voltage plays important role in PD occurrence.…”
Section: B Partial Discharge Inceptionmentioning
confidence: 99%