2012
DOI: 10.1002/xrs.2394
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Loose‐powder technique for X‐ray fluorescence analysis of ancient pottery using a small (100 mg) powdered sample

Abstract: A molded-loose-powder technique using a small powdered sample (100 mg) was developed for the X-ray fluorescence analysis of 22 components () in ancient pottery. This loose powder specimen was prepared by pressing the small powdered sample into a sample holder, formed from a stainless steel disk (48-mm diameter  0.8-mm height) with a hole (11-mm diameter), by hand. Calibration standards were prepared by homogenizing chemical reagents containing these 22 analytes using the concentration ranges of 166 ancient po… Show more

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Cited by 23 publications
(18 citation statements)
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“…Sample thickness is an important parameter for XRF analysis . Samples with sufficient thickness are desirable to avoid analytical errors resulting from a difference in the absorption effects.…”
Section: Resultsmentioning
confidence: 99%
“…Sample thickness is an important parameter for XRF analysis . Samples with sufficient thickness are desirable to avoid analytical errors resulting from a difference in the absorption effects.…”
Section: Resultsmentioning
confidence: 99%
“…The intervals optimized evenness for ten major oxides and bias toward low concentration for 24 minor elements. The composition of the calibration standard set was constructed by reference to recommended values of Geological Survey of Japan geochemical references and calibration ranges of igneous rock and ancient pottery …”
Section: Resultsmentioning
confidence: 99%
“…These reagents all exhibited particle sizes less than 10 μm, as reported elsewhere. 22) All reagents were dried under the appropriate conditions 23) using an electric furnace (FUM312PA; Toyo Seisakusho Kaisha, Ltd., Japan).…”
Section: Reagents For Standardsmentioning
confidence: 99%
“…A measurement chamber in the spectrometer was regulated at a vacuum of several Pascals to analyze the molded loose powder specimens. 22) The measurement diameter was 10 mm. Two collimators, arranged between a sample and a dispersive crystal, were used for the present measurements: a coarse collimator (450 μm slits) for Al, Si, Ca, and Fe, which is regular size, and a fine collimator (150 μm slits) for Mg to prevent overlap with Ca Kα (n = 3).…”
Section: Xrf Measurementsmentioning
confidence: 99%
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