Low-Angle X-Ray Spectroscopy and Reflectometry Techniques in Interdisciplinary Applications

Kubala‐Kukuś, A.; Banaś, D.; Pajek, M.; Braziewicz, J.; Góźdż, Stanisław; Szlachetko, Jakub; Semaniak, J.; loński, L. Jab; Jagodziński, P.; Piwowarczyk, M.; Sobota, D.; Stabrawa, I.; Stachura, R.; Szary, Karol; Wudarczyk-Moćko, J.

doi:10.12693/aphyspola.139.247

Cited by 3 publications

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“…A review on low-angle X-ray-based analysis at the Jan Kochanowski University in Kielce illustrated 69 nicely the capabilities of sensitive surface and subsurface methods such as TXRF spectrometry, GEXRF spectrometry, GIXRF spectrometry, XRR and TRXPS. Recently, the Chambre d’Analyse Spectrométrique en Transmission ou en Réflexion (CASTOR), which combines low-angle-based techniques (XRR, TXRF spectrometry and GIXRF spectrometry), was commissioned 70 at Soleil.…”

Section: Grazing X-ray Techniques Including Txrf Spectrometrymentioning

confidence: 99%

Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications

Vanhoof

Bacon

Fittschen

et al. 2022

J. Anal. At. Spectrom.

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Section: Grazing X-ray Techniques Including Txrf Spectrometrymentioning

confidence: 99%

Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications

Vanhoof

Bacon

Fittschen

et al. 2022

J. Anal. At. Spectrom.

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“…A paper by Kubala-Kukus et al described a plethora of low angle X-ray techniques including: total reflection X-ray fluorescence (TXRF), grazing emission X-ray fluorescence (GEXRF), grazing incidence X-ray fluorescence (GIXRF), X-ray reflectometry (XRR) and total reflection X-ray photoelectron spectroscopy (TRXPS). 205 The paper is not a review. Instead it is more of a list of techniques available at the Institute of Physics of the Jan Kochanowski University in Kielce, or the collaborations they have made with other institutions.…”

Section: Inorganic Materialsmentioning

confidence: 99%

Atomic spectrometry update: review of advances in the analysis of metals, chemicals and materials

Carter¹,

Clough

Fisher

et al. 2022

J. Anal. At. Spectrom.

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“…Specific aspects of measurement geometry in the regime of total external reflection of X-ray is physical basis of low-angle X-ray spectroscopy, diffraction, and reflectometry techniques such as total reflection X-ray fluorescence (TXRF) [3], grazing incidence X-ray fluorescence (GIXRF) [3], grazing emission X-ray fluorescence (GEXRF) [3,9,10], grazing incidence X-Ray diffraction (GIXRD) [11], and the X-ray reflectometry [12]. These techniques are often used to analyze nanolayers, which facilitates determining various properties of sample surfaces, e.g., elemental and chemical composition, morphology, density, thickness, roughness, and depth profile, also by our atomic physics and nanophysics group, in different applications [3,[13][14][15].…”

Section: Introductionmentioning

confidence: 99%

X-ray Photoelectron Spectroscopy in the Analysis of Titanium and Palladium Nanolayers

Wesołowski,

Kubala-Kukuś,

Banaś

et al. 2024

Acta Phys. Pol. A

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In the presented study, X-ray photoelectron spectroscopy and total reflection X-ray photoelectron spectroscopy methods were applied to analyze the Ti (75 nm) and Pd (100 nm) nanolayers deposited on the Si substrate using magnetron sputtering. The aim of the research was to determine the elemental composition and surface homogeneity of the analyzed nanolayers before their irradiation with highly charged xenon ions and to estimate the detection limit of the X-ray photoelectron spectroscopy technique for various glancing angles. The measurements were conducted using the SPECS mono-XPS system in the Institute of Physics at the Jan Kochanowski University (Kielce, Poland). The experimental setup and measurement conditions for the studied Ti and Pd layers are described. The X-ray photoelectron spectroscopy spectra were registered both for the non-total (35 • and 10 • angles) and total reflection (2.2 • for the Pd nanolayer and 1.5 • for the Ti nanolayer) regimes. The position of the C 1s photoelectron peak was applied (C-C component, binding energy 284.8 eV) to calibrate energy. First, the homogeneity of the nanolayers was investigated. The analysis of spectra concentrated on investigating the photoelectron peaks and, consequently, on determining the following: the binding energy of electrons, the intensity and full width at half maximum of photoelectron peaks, the background level, and the elemental composition of the nanolayer surface. In this study, the detection limit of the X-ray photoelectron spectroscopy measurements for different photoelectron peaks was calculated in relation to the excitation angle. An improvement of the X-ray photoelectron spectroscopy detection limit by a factor of 3-6, depending on the type of photoelectron peak, was observed for the angles below the critical angle of the X-ray total reflection phenomenon. topics: Ti and Pd nanolayers, X-ray photoelectron spectroscopy (XPS), total reflection XPS

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Low-Angle X-Ray Spectroscopy and Reflectometry Techniques in Interdisciplinary Applications

Cited by 3 publications

References 0 publications

Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications

Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications

Atomic spectrometry update: review of advances in the analysis of metals, chemicals and materials

X-ray Photoelectron Spectroscopy in the Analysis of Titanium and Palladium Nanolayers

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