Low-cost high-resolution handheld VNA using RF interferometry

Will, K.; Meyer, Tobias; Omar, A.S.

doi:10.1109/mwsym.2008.4633181

Cited by 5 publications

(5 citation statements)

References 2 publications

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“…Therefore, a measured test signal is interfered using a phase adjustable reference signal of the same frequency. The test signal can be written as (4) and the reference signal (5) where is the common frequency, is the amplitude, and is the phase of the corresponding RF signal. The phase of the reference signal is stepped with respect to the phase of the test signal .…”

Section: Rf Interferometrymentioning

confidence: 99%

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Phase Measurement of RF Devices Using Phase-Shifting Interferometry

Will

Omar

2008

IEEE Trans. Microwave Theory Techn.

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A novel measurement technique is introduced for high-resolution phase measurements of RF devices. It is based on phase-shifting interferometry and is, therefore, fairly independent of the absolute magnitude of the measured RF signal, as demonstrated by measurements. A low-cost vector network analyzer (VNA) working up to a frequency of 150 MHz is presented using a multiple output direct digital synthesizer and low-cost scalar detectors. Furthermore, a wideband RF synthesizer architecture capable of generating multiple synchronized phase adjustable RF signals is developed. A homodyne reflectometer based on RF interferometry and the presented synthesizer is introduced. Accuracy limitations due to nonlinear power detectors and harmonics using the homodyne approach are demonstrated by measurements. A heterodyne reflection test set using the novel phase measurement technique at a constant IF is developed to solve these accuracy limitations. The performances of both interferometric reflection test sets are verified by measurements and compared to commercially available VNAs.Index Terms-Direct digital synthesizer (DDS), interferometry, phase measurement, synthesizer, vector network analyzer (VNA).

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Section: Rf Interferometrymentioning

confidence: 99%

“…A handheld VNA using a multiple output DDS and low-cost scalar detectors for interferometric measurements was devel- oped, built, and tested [5]. A simplified block diagram is shown in Fig.…”

Section: Low-cost Handheld Vna For Hf/vhf Using Rf Interferometrymentioning

confidence: 99%

Phase Measurement of RF Devices Using Phase-Shifting Interferometry

Will

Omar

2008

IEEE Trans. Microwave Theory Techn.

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“…In recent years, Vector Network Analysers (VNAs) have become more accessible due to their low cost [6], [7]. However, the quality of the measurements relies heavily on the calibration procedure.…”

Section: Introductionmentioning

confidence: 99%

Estimation of microwave resonant measurements uncertainty from uncalibrated data

et al. 2020

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<div><p class="Abstract">We present an extended study on the uncertainty in resonant measurements. The uncertainty of the resonant frequency and quality factor was estimated. Two different measurement systems and different fitting approaches were used. The effect of the use of uncalibrated resonant curves on uncertainty was extensively studied. For the uncalibrated data the systematic contribution to the uncertainty was determined.</p></div>

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“…Progress in the hardware operating at GHz frequencies opened the possibility to create more portable stand-alone measurement devices [10]. In the last years a wide range of low-cost VNAs became available on the market [11,12]. Another low price solution is represented by scalar network analyzers.…”

Section: Introductionmentioning

confidence: 99%

Frequency span optimization for asymmetric resonance curve fitting

Torokhtii¹,

Alimenti²,

Pompeo³

et al. 2020

Preprint

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The wide application of the modern resonant measurement techniques makes all the steps of the measuring process, including data acquisition more efficient and reliable. Here we investigate the multidimensional space of the parameters to determine the optimum span for resonant measurements. The study concentrated on experimental systems with standard performance and capabilities. We determine the range of the optimum span for the resonant frequency and quality factor by simulating and fitting resonant curves with different levels of asymmetry.

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Low-cost high-resolution handheld VNA using RF interferometry

Cited by 5 publications

References 2 publications

Phase Measurement of RF Devices Using Phase-Shifting Interferometry

Phase Measurement of RF Devices Using Phase-Shifting Interferometry

Estimation of microwave resonant measurements uncertainty from uncalibrated data

Frequency span optimization for asymmetric resonance curve fitting

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