Low cost scaleable parallel image processing system

Harvey, David M.; Kshirsagar, S. P.; Hobson, Clifford Allan

doi:10.1016/s0141-9331(01)00107-7

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2023

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Cited by 12 publications

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“…machine vision can rea lize the non-contact inspection of products whi le most round ness measuring instruments are contact-type . The development ofa machine vision sys\cm ror inspection has rece ived considerable attention [5][6][7][8][9]. The adv<llltages of using such automa~ic systems include a decrease in the time required for measurement .as well as the greater accuracy of measurement ,md better fiexibility than the conventionallllethods.…”

Section: Introductionmentioning

confidence: 99%