Nomenclature
A= Plasma capacitance gauge area, m 2 A p = instantaneous grain port cross-sectional area, Eq. (4), cm 2 a = classical regression law constant, Eq. (1) b = curve-fit exponent C = mechanical wave velocity, m/s C = general constant, Eq. (6) dP/dt = pressure gradient, MPa/s G 0 = oxidizer mass flux, Eq. (1), kg/cm 2 · s I (θ) = x-ray intensity arriving at the input screen of the image intensifier at an angle of θ , R/s I 0 = initial x-ray intensity, R/s k = wave number k P = wave velocity variation coefficient with respect to pressure, MPa −1 k T = wave velocity variation coefficient with respect to temperature, K −1 168 F. CAUTY ET AL. L (θ) = interaction length of x ray and material, m 0 = initial thickness, m m = linear attenuation coefficient of photoelectric absorption, m −1 m 0 = oxidizer mass flow rate, Eq. (3), kg/s n = classical regression law exponent, Eq. (1) P = pressure, MPa R f = cumulative web regression at time t f , Eq. (8), cm R p = initial grain port radius at t = 0, Eq. (4), cm R t = cumulative web regression at time t, Eq. (2), cm r = instantaneous surface regression rate, Eq. (1), cm/s r b , R b = burning rate, mm/s T = temperature, K t = time, Eq. (6), s t f = elapsed time between first and last data point, s ΔC = capacitance change ε = permittivity or dielectric constant λ = wavelength, m σ P = initial temperature sensitivity of the burning rate at constant pressure, K −1 τ = propagation time, μs Subscripts φ = phase shift, deg b = burning c = cutoff G = grain P = pressure ref = reference conditions T = temperature 0 = initial conditions