2021
DOI: 10.3390/coatings11101158
|View full text |Cite
|
Sign up to set email alerts
|

Low Electron Temperature Plasma Diagnosis: Revisiting Langmuir Electrostatic Probes

Abstract: This article describes a method of measurement of the current-to-probe voltage characteristic curve of a Langmuir electrostatic probe immersed in a plasma characterized by a low electron temperature that is only one order of magnitude higher than room temperature. These plasmas are widely used in industrial processes related to surface technology, polymers, cleaning, nanostructures, etc. The measurement method complies with the strict requirements to perform representative plasma diagnosis, particularly in the… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(2 citation statements)
references
References 76 publications
0
2
0
Order By: Relevance
“…Among the contact methods for plasma diagnostics, electrical probes are the least expensive, yet the fastest and most reliable diagnostic tools, providing values for plasma parameters such as plasma potential (Vp), electron temperature (Te), electron (Ne), and ion (Ni) densities, as well as the distribution functions (EEDF) of the charged particles (electrons and ions) [30][31][32]. A complete fixed probe system consists of an interface unit (EPIU-ESPION Probe Interface Unit), a gas-cooled, radio-frequency electrostatically compensated probe, and connection cables.…”
Section: Methodsmentioning
confidence: 99%
“…Among the contact methods for plasma diagnostics, electrical probes are the least expensive, yet the fastest and most reliable diagnostic tools, providing values for plasma parameters such as plasma potential (Vp), electron temperature (Te), electron (Ne), and ion (Ni) densities, as well as the distribution functions (EEDF) of the charged particles (electrons and ions) [30][31][32]. A complete fixed probe system consists of an interface unit (EPIU-ESPION Probe Interface Unit), a gas-cooled, radio-frequency electrostatically compensated probe, and connection cables.…”
Section: Methodsmentioning
confidence: 99%
“…Low-temperature plasmas have been actively investigated in many academic research studies and industrial fields [ 1 , 2 , 3 , 4 , 5 ]. Especially in semiconductor manufacturing, it is important to carefully monitor the dynamics of low-temperature plasmas within a processing chamber to increase semiconductor yield.…”
Section: Introductionmentioning
confidence: 99%