J. Electron. Mater.
 2024
DOI: 10.1007/s11664-024-11458-2
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Low-Energy Xe Ion Beam-Mediated Defect Engineering in Optical, Electronic, Structural, and Morphological Properties of Sputtered MoS2 Thin Films

Aniket Bharti,
Deepika Gupta,
Deepika
et al.
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