2017
DOI: 10.1016/j.tsf.2017.01.040
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Low-field magnetoresistance and switching behavior of polycrystalline La 0.66 Sr 0.34 MnO 3 /YSZ(001) films with columnar grain structure

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Cited by 8 publications
(5 citation statements)
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“…As can be seen from Figure b–e, the absolute LFMR decreases with increasing temperature (≈25% at 5 K, 17% at 100 K, 8% at 200 K, and 2% at 300 K). These values are similar or slightly higher than those obtained from solution-processed LSMO or related perovskite-type manganese oxides …”
Section: Resultssupporting
confidence: 70%
See 1 more Smart Citation
“…As can be seen from Figure b–e, the absolute LFMR decreases with increasing temperature (≈25% at 5 K, 17% at 100 K, 8% at 200 K, and 2% at 300 K). These values are similar or slightly higher than those obtained from solution-processed LSMO or related perovskite-type manganese oxides …”
Section: Resultssupporting
confidence: 70%
“…These values are similar or slightly higher than those obtained from solution-processed LSMO or related perovskite-type manganese oxides. 57 Finally, we demonstrate that carriers can be electrostatically induced into the films via capacitive double-layer charging. This is intriguing as it allows tuning of the magnetization in situ.…”
Section: Acs Applied Materials and Interfacesmentioning
confidence: 82%
“…1b). A similar pattern was observed for a La 0.66 Sr 0.34 MnO 3 /YSZ film in [14]. This structure is formed by columnar oriented crystallites grown throughout the film thickness, which radically differs from the island character of growth of epitaxial LBM/STO films [15].…”
Section: Methodssupporting
confidence: 68%
“…2b) [20]. The authors of [21,22] experimentally showed that such temperature dependence of TMR in manganite films on YSZ substrates is associated with destruction of the coherence of the structural domain boundaries and appearance of polycrystallinity. Estimation of the degree of spin-polarization at T ?…”
Section: Temperature Dependencesmentioning
confidence: 99%
“…First of all, upon variation of the geometry of experiment and application of magnetic field either along (H||q) or perpendicular (H\q) to the film's surface, the influence of the form factor was 3 times less than the expected N = 4p for thin films. The reduced N value for the film with variant structure may be explained by the influence of structural domain boundaries on the dynamics of magnetic domains in applied magnetic field [21].…”
Section: Magnetic Field Dependencesmentioning
confidence: 99%