Low-Frequency Noise Sources and Back-Gate Coupling Effects in FDX-SOI Device

Yadav, Nandakishor; Raffel, Yannick; Olivo, Ricardo Revello; Pirro, Luca; Kämpfe, Thomas; Seidel, Konrad

doi:10.1109/iirw59383.2023.10477715

2023 IEEE International Integrated Reliability Workshop (IIRW) 2023

DOI: 10.1109/iirw59383.2023.10477715

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Low-Frequency Noise Sources and Back-Gate Coupling Effects in FDX-SOI Device

Nandakishor Yadav,

Yannick Raffel,

Ricardo Revello Olivo

et al.

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Low-Frequency Noise Sources and Back-Gate Coupling Effects in FDX-SOI Device

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References 12 publications

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