2023 International Conference on Noise and Fluctuations (ICNF) 2023
DOI: 10.1109/icnf57520.2023.10472764
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Low Frequency Noise Study of X-ray Irradiated Si/SiGe:C BiCMOS Technology Bipolar Transistors

A. Adebabay Belie,
J. El Beyrouthy,
F. Pascal
et al.
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