Chemically strengthened glass is widely used for screen protection in mobile devices, and its strengthening processes and application fields have rapidly diversified. The origin of the strength is residual compressive stress induced by ion exchange, and the stress evaluation has been performed via the photoelastic effect. However, for a deep understanding of the nature of the strength and development of stronger glasses, we need a method directly connected to atomic-scale glass structures. Here, we propose a method based on the "stuffing" effect, where we can determine the residual stress non-contactively and nondestructively with a high spatial resolution using Boson, D 1 , D 2 , and A 1 peaks in micro-Raman spectra. Finally, we show a plausible depth dependence of the residual stress.