2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) 2018
DOI: 10.1109/ispsd.2018.8393627
|View full text |Cite
|
Sign up to set email alerts
|

Low injection anode as positive spiral improvement for 650V RC-IGBT

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
4
0

Year Published

2019
2019
2023
2023

Publication Types

Select...
3
2

Relationship

1
4

Authors

Journals

citations
Cited by 7 publications
(4 citation statements)
references
References 4 publications
0
4
0
Order By: Relevance
“…When the IGBT is turned on again, the freewheeling diode enters the reverse recovery process, the excess carriers in the RC-IGBT body are extracted, the electrons flow out through the N + short circuit region, and the holes flow away from the P base region. Figure 8 shows the switching characteristics of the LE-RC-IGBT and conventional RC-IGBT [29,30]. The red and green curves represent the voltage and current values of the LE-RC-IGBT during the switching process, while the Con-RC-IGBT is blue and black curves.…”
Section: Fig 2comparison Of Forward Conduction Characteristics Betwee...mentioning
confidence: 99%
“…When the IGBT is turned on again, the freewheeling diode enters the reverse recovery process, the excess carriers in the RC-IGBT body are extracted, the electrons flow out through the N + short circuit region, and the holes flow away from the P base region. Figure 8 shows the switching characteristics of the LE-RC-IGBT and conventional RC-IGBT [29,30]. The red and green curves represent the voltage and current values of the LE-RC-IGBT during the switching process, while the Con-RC-IGBT is blue and black curves.…”
Section: Fig 2comparison Of Forward Conduction Characteristics Betwee...mentioning
confidence: 99%
“…Assuming higher frequency applications than the relatively low‐frequency cases mentioned above as DIPIPM TM , to break through a fundamental difficulty with improving the diode reverse recovery characteristics, the diode's hole injection efficiency is selectively reduced by a structural approach with minimum sacrifices in wafer process steps (Fig. 20) [65].…”
Section: High Power Density Solutionmentioning
confidence: 99%
“…RC-IGBT's backside pattern layout[51] Top views of IGBT module packages[51] Example of improved diode structure for RC-IGBT[65] (a) Conventional, (b) Low hole injection type…”
mentioning
confidence: 99%
“…Super-junction (SJ) technology has been proven owing the ability of alleviating the snapback effect in RC-SJBTs [5] and reduce switching loss of IGBTs [6,7], the reduced switching loss is also beneficial for reducing heat source, but it has not been applied into RC-IGBT designs. Local life time control [8,9] and Schottky controlled injection (SC) [10][11][12] are usually adopted to improve reverse recovery characteristics of FWD in RC-IGBTs, but they also deteriorate on-state characteristics of IGBT. Another way is to introduce auxiliary gate to control hole injection efficiency in sequence, which alleviate carriers in IGBT mode and reduce carriers in FWD mode, but that requires additional gate control signal and current direction detector.…”
Section: Introductionmentioning
confidence: 99%