Low-Power Programmable Pseudorandom Test Pattern Generators with Test Compression Capabilities

Abstract

-In this paper, a low-power programmable generator is proposed with a capability of producing required pseudorandom test patterns. The toggling levels and fault coverage gradients are adjustable in this work and are compared with the built-in self-test (BIST) based pseudorandom test pattern generators. To accomplish the objective of this paper a LFSR is tested with random variables and inputs and proved to be a better method as compared to the previous methods in the past. The proposed method could combine test compression with LBIST and both the systems could deliver high quality tests. Experimental results for the proposed design are reported herein with relevant outputs and expected outcomes.