1992
DOI: 10.1063/1.351630
|View full text |Cite
|
Sign up to set email alerts
|

Low-pressure chemical vapor deposition of copper: Dependence of the selectivity on the water vapor added to a hydrogen or helium carrier gas

Abstract: The selectivity of copper deposition from copper (II) bis-hexafluoroacetylacetonate on SiO2 patterned with a platinum seeding layer is studied as a function of the reagent gas mixture. On platinum, the copper film growth rate increases with the amount of water vapor in the gas flow, and is independent of the chemical nature of the carrier gas used (H2 or He). The selectivity of the copper deposition is significantly improved when using He rather than H2 as carrier gas, especially at high water vapor concentrat… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4

Citation Types

2
22
0

Year Published

1994
1994
2024
2024

Publication Types

Select...
5
2

Relationship

0
7

Authors

Journals

citations
Cited by 31 publications
(24 citation statements)
references
References 12 publications
2
22
0
Order By: Relevance
“…Large excesses of H 2 O appear to retard the Cu(hfa) 2 formation under these conditions and to reduce copper etching, resulting in a film stoichiometry being identical to gas phase composition. This is consistent with findings that H 2 O aids in the decomposition of Cu(hfa) 2 at temperatures as low as 250 ± C. 77,79 From the study of deposition rate as a function of precursor transport and substrate temperature, it can be concluded that the primary mechanism of BaCaCuO(F) MOCVD growth is mass transport-limited with the present precursor and reactor system. H 2 O in the oxidizer stream has little effect on the onset of mass transportlimited film growth for BaO and CaO deposition; however, it does significantly affect CuO deposition.…”
Section: B Mocvd Film Growth and Deposition Mechanismsupporting
confidence: 89%
See 3 more Smart Citations
“…Large excesses of H 2 O appear to retard the Cu(hfa) 2 formation under these conditions and to reduce copper etching, resulting in a film stoichiometry being identical to gas phase composition. This is consistent with findings that H 2 O aids in the decomposition of Cu(hfa) 2 at temperatures as low as 250 ± C. 77,79 From the study of deposition rate as a function of precursor transport and substrate temperature, it can be concluded that the primary mechanism of BaCaCuO(F) MOCVD growth is mass transport-limited with the present precursor and reactor system. H 2 O in the oxidizer stream has little effect on the onset of mass transportlimited film growth for BaO and CaO deposition; however, it does significantly affect CuO deposition.…”
Section: B Mocvd Film Growth and Deposition Mechanismsupporting
confidence: 89%
“…In principle, the effect of H 2 O on the decomposition of these precursors may be significant since it could act as a protonolytic reagent to form volatile Hhfa by-products. [77][78][79] To explore this possibility, the above experiment was conducted without water in the oxidizing stream. The same general results were observed with mass transport-limited deposition of Ba and Ca beginning near 400 ± C [ Fig.…”
Section: B Mocvd Film Growth and Deposition Mechanismmentioning
confidence: 99%
See 2 more Smart Citations
“…Only few systematic studies on the influence of water on β-diketonates under CVD conditions are available and their results often appear to be contradictory. For instance, it has been reported that CVD with a β-diketonate such as Cu(hfac) 2 as precursor in combination with H 2 as reducing agent can be area-selective, i.e., copper, in this case, is deposited on metal substrates but not on oxide areas 16 17 18 19 . When adding water to the reaction gas mixture, some authors found a loss of the precursor’s selectivity to metal substrates 19 while others reported, for apparently similar experiments, that the selectivity is unaffected 20 .…”
mentioning
confidence: 99%