Low Stress Encapsulants? Influence of Encapsulation Materials on Stress and Fracture of Thin Silicon Solar Cells as Revealed by Synchrotron X-ray Submicron Diffraction

Rengarajan, Karthic Narayanan; Radchenko, Ihor; Illya, Gregoria; Handara, Vincent; Kunz, Martin; Tamura, Nobumichi; Budiman, Arief Suriadi

doi:10.1016/j.proeng.2015.09.230

Cited by 18 publications

(2 citation statements)

References 19 publications

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“…Synchrotron X-ray microdiffraction (μSXRD) has proven to be effective for revealing insights of mechanical stress and other mechanics considerations in small-scale crystalline structures in many important technological applications, such as microelectronics (Budiman et al, 2006(Budiman et al, , 2009(Budiman et al, , 2010Kim et al, 2012a), nanotechnology (Budiman et al, 2012b,c;Kim et al, 2012b), and photovoltaics (Rengarajan et al, 2016;Handara et al, 2017;Tippabhotla et al, 2017a). This is especially true where the knowledge of how the stress evolves during the operation of the device could reveal the effective methodology to design higherperformance, more robust, and reliable nanostructure-based systems.…”

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confidence: 99%

Probing Stress States in Silicon Nanowires During Electrochemical Lithiation Using In Situ Synchrotron X-Ray Microdiffraction

et al. 2018

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Silicon is considered as a promising anode material for the next-generation lithium-ion battery (LIB) due to its high capacity at nanoscale. However, silicon expands up to 300% during lithiation, which induces high stresses and leads to fractures. To design silicon nanostructures that could minimize fracture, it is important to understand and characterize stress states in the silicon nanostructures during lithiation. Synchrotron X-ray microdiffraction has proven to be effective in revealing insights of mechanical stress and other mechanics considerations in small-scale crystalline structures used in many important technological applications, such as microelectronics, nanotechnology, and energy systems. In the present study, an in situ synchrotron X-ray microdiffraction experiment was conducted to elucidate the mechanical stress states during the first electrochemical cycle of lithiation in single-crystalline silicon nanowires (SiNWs) in an LIB test cell. Morphological changes in the SiNWs at different levels of lithiation were also studied using scanning electron microscope (SEM). It was found from SEM observation that lithiation commenced predominantly at the top surface of SiNWs followed by further progression toward the bottom of the SiNWs gradually. The hydrostatic stress of the crystalline core of the SiNWs at different levels of electrochemical lithiation was determined using the in situ synchrotron X-ray microdiffraction technique. We found that the crystalline core of the SiNWs became highly compressive (up to -325.5 MPa) once lithiation started. This finding helps unravel insights about mechanical stress states in the SiNWs during the electrochemical lithiation, which could potentially pave the path toward the fracture-free design of silicon nanostructure anode materials in the next-generation LIB.

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Probing Stress States in Silicon Nanowires During Electrochemical Lithiation Using In Situ Synchrotron X-Ray Microdiffraction

et al. 2018

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“…Conventional techniques such as high speed optical imaging are normally applicable to surface measurements and may suffer from poor signal-to-noise ratios during dynamic loading, while synchrotron x-rays are advantageous for high-speed x-ray imaging and diffraction owing to their high intensity and high penetration capability, high coherence, and high pulse repetition rate. Synchrotron x-ray techniques are particularly useful in elucidating microstructural evolution of advanced/novel materials [15][16][17][18] example, synchrotron x-ray microdiffraction has been widely used to study mechanical properties of multilayer structures (e.g., Cu/ Nb and Al/Nb) [17,[19][20][21] and thin films (e.g., Si and GeTe) [22][23][24] under quasi-static loading. The elastic-plastic transition and residual stress of samples at lattice scales can be mapped through diffraction scanning [14].…”

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Dynamic tensile deformation and damage of B4C-reinforced Al composites: Time-resolved imaging with synchrotron x-rays

Bie

Huang

et al. 2016

Materials Science and Engineering: A

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a b s t r a c tDynamic tensile experiments are conducted on 15% and 30% in weight percentage B 4 C/Al composites with a split Hopkinson tension bar, along with high-speed synchrotron x-ray digital image correlation (XDIC) to map strain fields at μm and μs scales. As manifested by bulk-scale stress-strain curves, a higher particle content leads to a higher yield strength but lower ductility. Strain field mapping by XDIC demonstrates that tension deformation and tensile fracture, as opposed to shear and shear failure, dominate deformation and failure of the composites. The fractographs of recovered samples show consistent features. The particle-matrix interfaces are nucleation sites for strain localizations, and their propagation and coalescence are diffused by the Al matrix. The reduced spacing between strain localization sites with increasing particle content, facilitates their coalescence and leads to decreased ductility. Designing a particle-reinforced, metallic-matrix composite with balanced strength and ductility should consider optimizing the inter-particle distance as a key parameter.

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Driving Sustainable Growth: Leveraging Digital Transformation in Photovoltaic Manufacturing

Ramirez-Peña,

Barba,

Otero-Mateo

et al. 2024

Lecture Notes in Information Systems and Organisation

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Low Stress Encapsulants? Influence of Encapsulation Materials on Stress and Fracture of Thin Silicon Solar Cells as Revealed by Synchrotron X-ray Submicron Diffraction

Cited by 18 publications

References 19 publications

Probing Stress States in Silicon Nanowires During Electrochemical Lithiation Using In Situ Synchrotron X-Ray Microdiffraction

Probing Stress States in Silicon Nanowires During Electrochemical Lithiation Using In Situ Synchrotron X-Ray Microdiffraction

Dynamic tensile deformation and damage of B4C-reinforced Al composites: Time-resolved imaging with synchrotron x-rays

Driving Sustainable Growth: Leveraging Digital Transformation in Photovoltaic Manufacturing

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