We investigated the post-deposition-heating (PDH) effect on OH-content in the SiOx films deposited by atmospheric-pressure CVD using a deposition source of silicone oil (SO) with O3 and TCE vapor at the temperature Td of 180 to 250 oC. The PDH is performed in-situ for 5 min in the deposition chamber just after film deposition without supply of SO, where the heating temperature is the same as Td. OH contents in the films deposited normally are decreased with increasing Td. On the contrary, those with PDH are decreased with deceasing Td from 220 oC, and, at Td = 190 oC, a minimum OH content can be obtained. This means that lower OH content remains at a lower deposition temperature. This PDH effect on OH reduction can be explained by easily-reconstructible structure of SiOx films deposited at low temperature. Further, we discussed mechanism of the PDH effect from the other points.