2009
DOI: 10.1143/jjap.48.035502
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Low-Temperature Deposition of Silicon Oxide Film from the Reaction of Silicone Oil Vapor and Ozone Gas

Abstract: A compact, low-height prototype of a six-axis precise positioning stage for microfabrication h a s been developed. X and Y stage positioning requires nanometer positioning resolution and robustness against atmospheric turbulence. The stiffness and dead play of the traveling mechanism were improved by using rolling contact guides, and the positioning resolution was improved by using a iriction drive mechanism. Anaiog signais from a n opticai h e a r scaie are influenced little by atmospheric turbulence. Using t… Show more

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Cited by 16 publications
(19 citation statements)
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“…The deposition rate was too low, e.g., 1 nm/min at 200 ºC for the case of without organic solution [33]. But in our study, the deposition rate was 11.85 nm/min at 200 ºC by using organic solution.…”
Section: Discussioncontrasting
confidence: 68%
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“…The deposition rate was too low, e.g., 1 nm/min at 200 ºC for the case of without organic solution [33]. But in our study, the deposition rate was 11.85 nm/min at 200 ºC by using organic solution.…”
Section: Discussioncontrasting
confidence: 68%
“…They were chemically cleaned by hot ammoniacal solution (NH 4 In our experimental process,O 3 is decomposed to O 2 and reactive O shown in equation (1). This decomposition is dependent on deposition temperature [33,34]. Oliver R.Wulf& Richard C. Tolman specified the range of decomposition temperature that is 148 ºC to 179 ºC [34].Since the O is very chemically active, the overall reaction of the process of reactive oxygen and SO is shown in equation (2).…”
Section: Introductionmentioning
confidence: 99%
“…13) However, using TCE for the SiO x film deposition with SO + O 3 , the deposited films still contain a large number of OH bonds, which have been reported to lead to the serious problems of high leakage current and low breakdown voltage. 8,[14][15][16] Generally, low-temperature SiO x films prepared by CVD methods with organic silicon sources, such as TEOS, are more likely to contain a large number of OH bonds when no special treatment is carried out, e.g. postdeposition annealing.…”
Section: Ohmentioning
confidence: 99%
“…lower leakage current and higher breakdown voltage. 8,17,18) However, high-temperature annealing may lose some effectiveness of the lowtemperature deposition process. Therefore, in order to reduce the number of residual OH bonds before removing a deposited film from the deposition chamber, we treated a deposited SiO x film by in-site post-deposition heating (PDH) and compared the OH content with that of a non-PDH(NPDH)-treated film.…”
Section: Ohmentioning
confidence: 99%
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