1994
DOI: 10.1016/0040-6090(94)90244-5
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Low-temperature epitaxial growth of undoped and n-doped silicon by photochemical vapor deposition using SiH4/SiH2Cl2/H2/PH3 mixtures

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Cited by 5 publications
(4 citation statements)
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“…The deposition rate for the intrinsic Si film reached 4.0 nm/s, which is substantially higher than that of many other MWPECVD processes using SiH 4 /H 2 or SiH 2 Cl 2 /H 2 as precursor. , On the other hand, the deposition rate of both P- and B-doped Si films increased linearly with the increase in the number of solid doping targets after adopting the SSSDS process. Maximum deposition rates of 4.66 and 4.45 nm/s obtained in the present study for the conditions P(12) and B(12), respectively, are much higher than those of other CVD processes using SiH 4 as precursors with various gaseous doping sources. Enhancement of the deposition rate for the doped Si film may be attributed to the incorporation of dopants in the Si film. Moreover, the morphology markedly changed from columnar morphology to featureless noncolumnar when the number of solid doping targets increased.…”
Section: Resultsmentioning
confidence: 49%
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“…The deposition rate for the intrinsic Si film reached 4.0 nm/s, which is substantially higher than that of many other MWPECVD processes using SiH 4 /H 2 or SiH 2 Cl 2 /H 2 as precursor. , On the other hand, the deposition rate of both P- and B-doped Si films increased linearly with the increase in the number of solid doping targets after adopting the SSSDS process. Maximum deposition rates of 4.66 and 4.45 nm/s obtained in the present study for the conditions P(12) and B(12), respectively, are much higher than those of other CVD processes using SiH 4 as precursors with various gaseous doping sources. Enhancement of the deposition rate for the doped Si film may be attributed to the incorporation of dopants in the Si film. Moreover, the morphology markedly changed from columnar morphology to featureless noncolumnar when the number of solid doping targets increased.…”
Section: Resultsmentioning
confidence: 49%
“…In such a process, a decomposed Si-based precursor is reacted with the doping source through a series of gas-phase reactions in a range of deposition methods to synthesize doped Si film. These methods include plasma-enhanced chemical vapor deposition (PECVD), hot-wire chemical vapor deposition (HWCVD), and photochemical vapor deposition (photo-CVD). Dopants for acceptor impurities belong group III (B) and donor impurities belong group V (P) are extensively used to form p -type and n -type characters, respectively. Various doping sources for B include diborane (B 2 H 6 ), trimethylboron (B­(CH 3 ) 3 ), and boron trifluoride (BF 3 ), and sources for P include phosphane (PH 3 ) and phosphorus trichloride (PCl 3 ) .…”
Section: Introductionmentioning
confidence: 99%
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“…Epitaxial growth at very low temperatures below 200°C has been achieved using photoassisted CVD. 3 Here, however, defects and dislocations have not yet been effectively suppressed.…”
Section: Introductionmentioning
confidence: 97%