2012
DOI: 10.1002/pssa.201228270
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Low temperature growth of nanocrystalline and ultrananocrystalline diamond films: A comparison

Abstract: In this paper the low temperature deposition of nanocrystalline and ultrananocrystalline diamond (UNCD) films is compared and discussed. NCD films were prepared by hot filament chemical vapor deposition from a 1% CH4/H2 mixture, while microwave plasma chemical vapour deposition was used to deposit UNCD films from a mixture of 17% CH4/N2. The resulting films have been thoroughly characterized concerning their morphology and structure by scanning electron microscopy and concerning their crystalline properties by… Show more

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Cited by 29 publications
(14 citation statements)
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“…The overgrowth of the monocrystalline diamond pillars was performed referring to ref. in a self‐designed HFCVD setup described elsewhere . Prior to the overgrowth, the seven tungsten filaments (0.3 mm in diameter) were carburized.…”
Section: Methodsmentioning
confidence: 99%
“…The overgrowth of the monocrystalline diamond pillars was performed referring to ref. in a self‐designed HFCVD setup described elsewhere . Prior to the overgrowth, the seven tungsten filaments (0.3 mm in diameter) were carburized.…”
Section: Methodsmentioning
confidence: 99%
“…NCD films have been deposited by hot‐filament chemical vapor deposition from a 1% CH 4 /H 2 mixture. A self‐designed set‐up with seven tungsten filaments was used, which is capable to cover 3 inch wafers homogeneously and which has been described in detail in a previous publication . The major deposition parameters are summarized in Table .…”
Section: Methodsmentioning
confidence: 99%
“…Detailed information about the setup can be found in Ref. . The other main growth parameters were as following: substrate temperature ca.…”
Section: Methodsmentioning
confidence: 99%
“…600 nm (after 3 h deposition) were closed and showed well‐facetted topography with crystallite sizes in the range of a few hundreds of nm at most. They were thoroughly characterized in an earlier work by scanning electron microscopy (SEM), X‐ray diffraction, X‐ray photo‐electron spectroscopy, and Raman spectroscopy . The initial thickness of the films investigated in the current study was ca.…”
Section: Methodsmentioning
confidence: 99%