2020
DOI: 10.1063/5.0031600
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Low-temperature mobility-lifetime product in synthetic diamond

Abstract: Mobility-lifetime (µτ ) product is an important parameter that determines the performance of electronic and photonic devices. To overcome the previously reported difficulties in measuring the µτ product at cryogenic temperatures, we implement a time-resolved cyclotron resonance method to determine the carrier lifetime τ . After clarifying the difference between the AC and DC mobilities measured by the cyclotron resonance and time-of-flight methods, respectively, we demonstrate an inverse temperature dependence… Show more

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Cited by 13 publications
(6 citation statements)
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“…Decreasing temperature trend of the mu-tau product for both charge carrier types has been observed before in natural diamonds [39]. Continuation of the same trend was observed for high-purity scCVD diamonds in recent measurements for the low temperature region (2K-RT), demonstrating a strong increase in mu-tau with decreasing temperature [40]. However, even though there were other reports of mutau performance of high-purity synthetic diamonds at elevated temperatures [13,41], the systematic study is still missing in the available literature.…”
Section: Mobility-lifetime Measurementssupporting
confidence: 80%
“…Decreasing temperature trend of the mu-tau product for both charge carrier types has been observed before in natural diamonds [39]. Continuation of the same trend was observed for high-purity scCVD diamonds in recent measurements for the low temperature region (2K-RT), demonstrating a strong increase in mu-tau with decreasing temperature [40]. However, even though there were other reports of mutau performance of high-purity synthetic diamonds at elevated temperatures [13,41], the systematic study is still missing in the available literature.…”
Section: Mobility-lifetime Measurementssupporting
confidence: 80%
“…The hole mobility values reported here are also higher than those of electrons in diamond measured by UV-ToF [17] as shown Fig. 3e.…”
Section: Temperature Dependence Of the Drift Velocity And Carrier Mob...supporting
confidence: 41%
“…Very high electron mobility was reported by both TCT [15] and cyclotron resonance techniques [16][17][18]. Recent CWCR experiments enabled researchers to assess electron mobility values up to 100 × 10 6 cm 2 V −1 s −1 at 3 K [18], which is 16 times higher than previously reported TRCR values.…”
Section: Introductionmentioning
confidence: 83%
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