2021
DOI: 10.1021/acsaem.1c00586
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Low-Temperature Oxide/Metal/Oxide Multilayer Films as Highly Transparent Conductive Electrodes for Optoelectronic Devices

Abstract: Transparent conductors are essential for optoelectronic devices and flexible electronic devices. Oxide/metal/oxide (OMO) multilayer films with outstanding photoelectric performance have become a promising alternative for traditional transparent conductive oxides (TCOs). Most of the oxide films in OMO are deposited by magnetron sputtering or thermal evaporation processes, while the strong ion bombardment or high temperatures would deteriorate the device performance. For example, to fabricate a semitransparent s… Show more

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Cited by 35 publications
(15 citation statements)
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“…From the refractive index n i and the extinction coefficient k i of the layer, the perpendicular components of the wave vector β i = ( k i 2 – q 2 ) 1/2 and the parallel components of the wave vector can be deduced. For the specific calculation process, refer to our previous research Figure b presents the simulated transmittance over the wavelength range of 400–1200 nm on the basis of the transfer matrix method, where the thickness of the Ag–Zn­(O) film is fixed at 5 nm.…”
Section: Results and Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…From the refractive index n i and the extinction coefficient k i of the layer, the perpendicular components of the wave vector β i = ( k i 2 – q 2 ) 1/2 and the parallel components of the wave vector can be deduced. For the specific calculation process, refer to our previous research Figure b presents the simulated transmittance over the wavelength range of 400–1200 nm on the basis of the transfer matrix method, where the thickness of the Ag–Zn­(O) film is fixed at 5 nm.…”
Section: Results and Discussionmentioning
confidence: 99%
“…For the specific calculation process, refer to our previous research. 53 Figure 4b presents the simulated transmittance over the wavelength range of 400−1200 nm on the basis of the transfer matrix method, where the thickness of the Ag−Zn(O) film is fixed at 5 nm. The simulated results show that the OMO compound films have higher transmittance when the top and bottom MGZO thicknesses are between 40 and 70 nm.…”
Section: Figure 3a−d Shows the Comparison Of The Characteristics Ofmentioning
confidence: 99%
“…In multi-layer oxide/metal/oxide electrodes, such as ZnO/Ag/IZO, GZO/Ag/GZO, ITO/Au/ITO, and MoO 3 /Ag/MoO 3 , the oxide layers increase the transmittance due to lower reflection at both metal interfaces and offer low resistance [76]. Grown via lowtemperature reactive plasma deposition (RPD), the damaging effects can be minimized, as proposed by Zhang et al, that come with other oxide deposition methods, such as thermal evaporation, atomic layer deposition (ALD), and magnetron sputtering [76].…”
Section: Transparent Electrodesmentioning
confidence: 99%
“…For instance, finite-difference time-domain (FDTD), transport matrix method, etc. [ 37 ]. Lee and coworkers measured the film thickness, refractive index, and extinction coefficient of the OMO electrode and performed optical simulations with Essential Macleod, and changed the thickness of the bottom and top oxide layers to increase the transmittance while keeping the R s constant, and similar to the experimentally measured data, the optimized SiInZnO (SIZO)/Ag/SIZO TE has 96.67% transmittance at 550 nm and R s is 6.41 Ω/sq [ 118 ].…”
Section: Oxide–metal–oxide Structurementioning
confidence: 99%
“…Therefore, the metal film is usually prepared with metal oxide to form an OMO structure [ 36 ]. OMO structure combines the high electrical conductivity of metal film with the superior optical transmittance of metal oxide, the property of its structure has also made it widely investigated [ 37 ].…”
Section: Introductionmentioning
confidence: 99%