2013
DOI: 10.1016/j.jlumin.2013.06.046
|View full text |Cite
|
Sign up to set email alerts
|

Low-temperature photoluminescence analysis of the γ-irradiation effect on the defect structure in Ge-doped CdTe single crystals

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
1
0

Year Published

2015
2015
2023
2023

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 6 publications
(2 citation statements)
references
References 23 publications
0
1
0
Order By: Relevance
“…They have also observed that optical dispersive parameters (lattice dielectric constant, infinite frequency dielectric constant, free carrier concentration, plasma frequency, and third-order non-linear optical susceptibility) decrease with increasing γ-irradiation dose. Nasieka et al [54] have explained the Low-temperature photoluminescence study of the effect of γ-irradiation on the defect structure in Ge-doped CdTe single crystals grown with vertical Bridgman technique. They have observed that even at low doses (~ 10 kGy) of γ-irradiation substantial changes in the photoluminescence properties have been observed that has been explained on the basis of radiation induced changes in the concentration of luminescence centers because of their interaction with fast electrons created in accordance with the Compton's phenomenon crystals even at low doses of irradiation and therefore defects structure is observed accordingly.…”
Section: γ-Irradiation Induced Effectmentioning
confidence: 99%
“…They have also observed that optical dispersive parameters (lattice dielectric constant, infinite frequency dielectric constant, free carrier concentration, plasma frequency, and third-order non-linear optical susceptibility) decrease with increasing γ-irradiation dose. Nasieka et al [54] have explained the Low-temperature photoluminescence study of the effect of γ-irradiation on the defect structure in Ge-doped CdTe single crystals grown with vertical Bridgman technique. They have observed that even at low doses (~ 10 kGy) of γ-irradiation substantial changes in the photoluminescence properties have been observed that has been explained on the basis of radiation induced changes in the concentration of luminescence centers because of their interaction with fast electrons created in accordance with the Compton's phenomenon crystals even at low doses of irradiation and therefore defects structure is observed accordingly.…”
Section: γ-Irradiation Induced Effectmentioning
confidence: 99%
“…Photoluminescence (PL), a powerful and nondestructive microscopic probing technique, is sensitive not only to the intrinsic bandgap but also to the energy levels of the defects around band edge, appropriate for observing the microstructural modification and revealing the irradiation damage mechanism. [17,18] Furthermore, the spatially resolved PL measurement enables a rapid examination of the in-plane homogeneity for focal plane array (FPA) PDs, providing a more comprehensive analysis for irradiation damage. [19,20] In this work, spatially resolved and temperature-dependent PL spectra are performed to investigate the influence on microstructure and spatial uniformity of an In 0.53 Ga 0.47 As/InP p-i-n FPA-PD induced by 20-krad(Si) γ irradiation.…”
Section: Introductionmentioning
confidence: 99%