2019
DOI: 10.1007/s10854-019-02156-5
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Low temperature sintering and dielectric properties of Li2MgTiO4 microwave ceramics with BaCu(B2O5) addition for LTCC applications

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Cited by 11 publications
(5 citation statements)
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“…The microwave performance of specimen was evaluated by an Agilent vector network analyzer (8720ES) and the Hakki-Coleman method, 11 and Archimedes' principle was used to calculate bulk volume densities. 12 The 𝜏 𝑓 value was determined by the following equation 13,14 :…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The microwave performance of specimen was evaluated by an Agilent vector network analyzer (8720ES) and the Hakki-Coleman method, 11 and Archimedes' principle was used to calculate bulk volume densities. 12 The 𝜏 𝑓 value was determined by the following equation 13,14 :…”
Section: Methodsmentioning
confidence: 99%
“…The microwave performance of specimen was evaluated by an Agilent vector network analyzer (8720ES) and the Hakki–Coleman method, 11 and Archimedes’ principle was used to calculate bulk volume densities 12 . The τf${\tau _f}$ value was determined by the following equation 13,14 : τfbadbreak=f(85C)f(25C)f(25C)×(8525)goodbreak×()ppmC\begin{equation} {\tau _f}=\frac{f(85^{\circ}{\rm{C}})-f(25^{\circ}{\rm{C}})}{f(25^{\circ}{\rm{C}}) \times (85-25)} \times \left(\frac{ppm}{^{\circ}{\rm{C}}} \right) \end{equation}…”
Section: Methodsmentioning
confidence: 99%
“…The microwave dielectric properties of the samples were tested by a Hakki-Coleman resonator method and an Agilent E8362B network analyzer (Agilent, USA) in a resonant cavity. The τf values of the ceramics were measured using a temperature chamber and calculated by equation (1) [12,28]:…”
Section: Methodsmentioning
confidence: 99%
“…In a resonant cavity, the microwave dielectric characteristics (εr${\varepsilon _r}$, Q 0.28em×0.28em${\rm{\;}} \times {\rm{\;}}$ f , and τf${\tau _f}$ values) of the specimens were examined using the Hakki–Coleman resonator technique and an Agilent 8720ES network analyzer (300 MHz–20 GHz). The τf${\tau _f}$ values were derived using the following equation 27,28 : τfbadbreak=f()85normalCf()25normalCf()25normalC×()8525goodbreak×106()ppm/normalC$$\begin{equation}{\tau _f} = \frac{{f\left( {85^\circ {\rm{C}}} \right) - f\left( {25^\circ {\rm{C}}} \right)}}{{f\left( {25^\circ {\rm{C}}} \right) \times \left( {85 - 25} \right)}} \times {10^6}\left( {{\rm{ppm}}/^\circ {\rm{C}}} \right)\end{equation}$$where ffalse(25Cfalse)$f( {25^\circ {\rm{C}}} )$ and ffalse(85Cfalse)$f( {85^\circ {\rm{C}}} )$ represent the resonant frequencies at 25 and 85°C, respectively. The measurement error of the dielectric constant, Q × f value, and the temperature coefficient of resonant frequency were <0.5% × εr${\varepsilon _r}$, 2% × Q × f , and 0.5 ppm/°C, respectively.…”
Section: Methodsmentioning
confidence: 99%
“…In a resonant cavity, the microwave dielectric characteristics (𝜀 𝑟 , Q × f, and 𝜏 𝑓 values) of the specimens were examined using the Hakki-Coleman resonator technique and an Agilent 8720ES network analyzer (300 MHz-20 GHz). The 𝜏 𝑓 values were derived using the following equation 27,28 :…”
Section: Introductionmentioning
confidence: 99%