2008 IEEE International Symposium on Circuits and Systems (ISCAS) 2008
DOI: 10.1109/iscas.2008.4541864
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Low Voltage, Low Power, Compact, High Accuracy, High Precision PTAT Temperature Sensor for Deep Sub-micron CMOS Systems

Abstract: Temperature measurement is becoming increasingly important in integrated circuits and microsystems; nevertheless, existing techniques for the integration of high accuracy, high precision temperature sensors are not optimal for deep submicron CMOS processes. Here we describe a low voltage, low power, compact, high accuracy, high precision temperature sensor for deep sub-micron CMOS systems; our approach takes advantage of charge balancing and charge sharing for low current consumption, does not use resistors fo… Show more

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Cited by 3 publications
(1 citation statement)
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“…The biasing current error ΔI and the voltage gain error ΔA may typically not be ignored and can degrade the measurement accuracy. For instance, in integrated circuits, it is generally possible to design bandgap voltage references [19][20][21][22][23][24][25] which, even in processes that do not allow the integration of good quality resistors, [26,27] can be reasonably accurate (curvature correction [20,21,[23][24][25]28] may be required for improved accuracy). By contrast, it is generally complex to design accurate current references because of the typically large tolerance of integrated resistors, thus resulting in significant ΔI errors.…”
Section: Resultsmentioning
confidence: 99%
“…The biasing current error ΔI and the voltage gain error ΔA may typically not be ignored and can degrade the measurement accuracy. For instance, in integrated circuits, it is generally possible to design bandgap voltage references [19][20][21][22][23][24][25] which, even in processes that do not allow the integration of good quality resistors, [26,27] can be reasonably accurate (curvature correction [20,21,[23][24][25]28] may be required for improved accuracy). By contrast, it is generally complex to design accurate current references because of the typically large tolerance of integrated resistors, thus resulting in significant ΔI errors.…”
Section: Resultsmentioning
confidence: 99%