1980
DOI: 10.1021/ic50210a006
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Lower valence fluorides of vanadium. 5. Dependence of structure and magnetic properties of tetragonal KxVF3 on composition

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Cited by 13 publications
(14 citation statements)
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“…Products were analyzed optically by stereoscopic and polarized microscopy and further characterized by X-ray powder diffraction (25 1C) and magnetic measurements from 4.2 to 300 K [8][9][10][11][12]. Chemical analyses of K, Rb, Cs, V, and F in the A x VF 3 compounds were in agreement with calculated values [7][8][9][10].…”
Section: Methodsmentioning
confidence: 57%
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“…Products were analyzed optically by stereoscopic and polarized microscopy and further characterized by X-ray powder diffraction (25 1C) and magnetic measurements from 4.2 to 300 K [8][9][10][11][12]. Chemical analyses of K, Rb, Cs, V, and F in the A x VF 3 compounds were in agreement with calculated values [7][8][9][10].…”
Section: Methodsmentioning
confidence: 57%
“…The compounds studied were previously characterized in this laboratory [7][8][9][10][11][12]. Every precaution was taken to ensure that the samples were oxygen free.…”
Section: Methodsmentioning
confidence: 99%
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