<i>In-situ</i> Observation of Electrode Surface Change by High-Speed AFM

Abstract

Dynamic behavior of electrochemical interfacial phenomena is key issue for material science. Scanning probe microscope can observe the surface on the nanoscale, however, it is difficult to discuss the reaction process due to poor temporal resolution. High-speed atomic force microscopy (HS-AFM) is one of powerful in-situ observation tools. Here, we would like to introduce the HS-AFM applications for electrochemistry, such as Cu electrodeposition, polyethylene glycol (PEG) adsorption, and nanobubble electrolytic evolution by HS-AFM.