<title>Applications of dispersive white-light spectral interferometry in optics</title>

Abstract

Various original applications of dispersive white-light spectral interferometry employing a low-resolution spectrometer and based on the equalization wavelength determinations are reviewed. First, the differential group refractive index dispersion or the chromatic dispersion of a dispersive sample of known thickness is measured determining the equalization wavelength as a function of the displacement of the interferometer mirror. Similarly, the effective thickness of a dispersive sample is determined measuring the mirror displacement as a function of the group refractive index of material. Second, the technique, which needs no phase retrieving procedure to be applied, is used to measure mirror distances and displacements when dispersion in a two-beam interferometer is known. Third, a technique of dispersive spectral interferometry is used for a slightly dispersive interferometer including the effect of thin films. The technique, which needs phase retrieving procedure to be applied in processing spectral interferograms resolved over a wide spectral range, is used to determine the spectral phase of thin films or the positions of the interferometer mirror.