<title>Applied possibilities for x-ray diffraction interferometry</title>

Multiple-wave diffraction in x-ray interferometers

“…The investigation was conducted in α CuKradiation 14 . The run of beams taking part in the formation of moiré patterns in the three-wave case is depicted in Fig.…”

“…Analysis of diffraction geometry shows that even in the case of three-wave diffraction and using the simplest types of interferometers it is possible to combine in one device several schemes of typical two-wave interferometers and multi-beam interferometry [8][9][10][11][12][13][14][15][16] .…”

Interferometric study of deformation fields arising at laser treatment of Si surface

“…To continue research started in [10][11][12][13][14][15][16] , this work studies displacement and deformation fields arising at laser radiation of the surface of Si single crystals.…”

“…For the first time, stresses in Si single crystals that arose at implantation of Boron ions in the interferometric analyzer were determined in 9 . The energy of packing defects in Si, deformations around the dislocation clusters, defects of interface and stress relaxation in epitaxial systems Si-Si, Ge-Si, GaP-Si, as well as the effect of ultrasonic deformations on moiré patterns were determined in [10][11][12][13][14] . Formation of moire patterns of deformation fields arising under the effect of point forces on the interferometric analyzer are detailed in 15,16 .…”

Reconstruction of a Residual Strain Field in a Crystal-Analyser of a $LLL$-Interferometer

“…В то же время, на формирование муаровой картины влияет много других факторов -макро-и микродеформационные поля, обусловленные структурным несовершенством и неоднородностью кристаллических блоков интерферометра и их отклонениями в геометрических характеристиках (нарушение плоскопараллельности пластин, кристаллографической разориентации и т.п.) [13,14,15].…”