&lt;title&gt;Current and ultimate limitations of scanning x-ray nanotomography&lt;/title&gt;

McNulty, Ian

doi:10.1117/12.450234

Cited by 6 publications

(5 citation statements)

References 9 publications

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“…X-ray scanning diffractometry has been extended to an about 100 nm beam. There is no principal technical limitation in a further reduction of X-ray beam size and for a more symmetric spot at a third generation SR source. , The reduction of spot size will be rather limited by the achievable flux density and the loss of structural information on a specific polymer due to radiation damage.…”

Section: Discussionmentioning

confidence: 99%

Rotational Disorder in Poly(p-phenylene terephthalamide) Fibers by X-ray Diffraction with a 100 nm Beam

2003

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Single fibers of poly(p-phenylene terephthalamide) (PPTA; brand names Kevlar x , where x = 29, 49, 149) have been scanned with an about 100 nm synchrotron radiation X-ray beam normal to the fiber axis. Models of rotational disorder of the crystalline domains are discussed based on Monte Carlo simulations of the spatial variation of the 110/200 reflection intensities. For Kevlar149 the principal disorder appears to be a rotational domain-disorder across the fiber. The data suggest also the presence of a core and possibly a skin layer, which are both more disordered. Kevlar29,49 appear to have the same type of layering but with different volume fractions. There is also some evidence for a volume fraction without rotational correlation, which might be related to a morphology formed at the onset of coagulation.

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Section: Discussionmentioning

confidence: 99%

Rotational Disorder in Poly(p-phenylene terephthalamide) Fibers by X-ray Diffraction with a 100 nm Beam

2003

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“…In the scanning microscopies, the pixels that make up an image are discrete samples made at a series of spatial locations at various different times [23]. There is no definite, fixed relationship between the image pixels in one projection and the next.…”

Section: Post-processing: Alignmentmentioning

confidence: 99%

“…In scanning tomography, the hierarchy of repeatability extends from the fast axis (the most 'rigid') to the slow axis [23]; in 3-D tomography, the slow axis is used to align projections in both the vertical and horizontal, and from this moment the vertical alignment is often not refined [25]. Once a sinogram is extracted from a particular slice of the tomogram, its alignment is further refined according to some criteria, usually relating to internal consistency.…”

Section: Post-processing: Alignmentmentioning

confidence: 99%

Spiral scanning X-ray fluorescence computed tomography

Jonge¹,

Kingston²,

Afshar³

et al. 2017

Opt. Express

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Scanning X-ray fluorescence tomography was once considered impractical due to prohibitive measurement time requirements but is now common for investigating metal distributions within small systems. A recent look-ahead to the possibilities of 4-generation synchrotron light sources [J. Synchrotron. Radiat. 21, 1031 (2014)] raised the possibility of a spiral-scanning measurement scheme where motion overheads are almost completely eliminated. Here we demonstrate the spiral scanning measurement and use Fourier ring correlation analysis to interrogate sources of resolution degradation. We develop an extension to the Fourier ring correlation formalism that enables direct determination of resolution from the measured sinogram data, greatly enhancing its power as a diagnostic tool for computed tomography.

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“…The reader interested in more details is directed elsewhere. 37,72,74,75,[97][98][99][100][101][102][103][104][105][106][107]…”

Section: Nanoctmentioning

confidence: 99%

Recent advances in X-ray microtomography applied to materials

Stock

2008

International Materials Reviews

447

208

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This review highlights recent advances in X-ray microcomputed tomography (microCT) as applied to materials, specifically advances made since the first materials microCT review appeared in International Materials Reviews. 1 Improvements in instrumentation are covered, and one focus is microCT using phase (as opposed to absorption) contrast. Instead of grouping studies by disciplines, the reviewed reports are organised by type of application, specifically the study of the spatial distribution of phases, of cellular solids (including static and temporally evolving structures, fibrous network solids, mineralised tissues and biomedical applications), of channel structures, of deformation, fatigue and fracture, of processing and of corrosion and environmental interactions. Metrology applications are covered briefly, and several applications where microCT is combined with position resolved X-ray scattering are described in more detail. The accuracy of microCT reconstructions is discussed before data handling challenges are outlined. The review closes with speculations on the future directions of materials microCT.

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<title>Current and ultimate limitations of scanning x-ray nanotomography</title>

Abstract: X-ray nanotomography has developed into a powerful new tool for three-dimensional structural analysis. The scanning approach offers capabilities that are competitive with full-field imaging. Current and ultimate limitations of nanotomography are examined in light of recent work.

Cited by 6 publications

References 9 publications

Rotational Disorder in Poly(p-phenylene terephthalamide) Fibers by X-ray Diffraction with a 100 nm Beam

Rotational Disorder in Poly(p-phenylene terephthalamide) Fibers by X-ray Diffraction with a 100 nm Beam

Spiral scanning X-ray fluorescence computed tomography

Recent advances in X-ray microtomography applied to materials

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