Abstract:We present the development of a near infrared image intensifier tube based on a Generation III configuration. The photocathode driving this tube is based on a negativeelectron-affinity (NEA) InGaAs design. The surface and crystalline quality of the InGaAs active layer for this device is characterized by x ray diffraction (XRD), micro-Raman spectroscopy, energy dispersive x-rays (EDX), and Auger spectroscopy. Room temperature and 77K photoluminescence (PL) and transmission measurements indicate the near infrare… Show more
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