<title>Imaging spectrometry: concepts and system trade-offs</title>

Abstract

The concept of imaging spectrometry is finding broad application in scientific instrumentation for Earth-based, airborne, and space applications. An imaging spectrometer is characterized by the combination of imaging with complete sampling in the spectral domain. In so doing, material identification can be accomplished and displayed in conjunction with the conventional recognizable image.An imaging spectrometer incorporates a wide variety of technologies, including focal plane arrays, imaging and spectrometer optics, and spectral dispersing devices. The design of a successful system involves a complex set of trade-offs incorporating the properties and limitations of the various technologies. For applications in the infrared, additional technologies such as focal plane cooling are required, and the other technologies present more limitations and constraints. This paper will describe the system design process for a typical application, and will discuss the system performance parameters and trade-offs, including choice of system architecture, signal to noise ratio, system resolution, spectral performance, calibration, and the effect of artifacts such as detector non-uniformity.

Hyperspectral spectro-imager survey for state of art concept identification

“…Virtual Conference 30 March-2 April 2021 a survey of the already existing hyperspectral imagers and innovative freeform designs to identify the most promising solutions to increase the compactness and the performance. Some survey of hyperspectral imagers has already been done in the past [29], [30]. However, the study performed in 1993 by Herring et al, is now outdated and cannot be used to identified state of art concepts.…”

Wide spectral range imaging interferometer

“…The Optical Path Difference (OPD) between the recombining beams linearly changes with the angle (slope) of the entering ray onto the instrument optical axis. It can be shown that the BS provides part of the phase-delay between the two interfering rays, the remaining part being originated outside the BS, and that the overall OPD linearly changes with varying the angle of the entering ray with respect to the instrumental optical axis [3][4][5]. Due to the absence of entrance slit the device acquires the image of the target superimposed to a fixed pattern of interference fringes.…”