&lt;title&gt;MIRAGE: large-format emitter arrays 1024 x 1024 and 1024 x 2048&lt;/title&gt;

McHugh, Stephen W.; Robinson, Richard; Parish, Bill; Woolaway, James T.

doi:10.1117/12.391709

Cited by 9 publications

(4 citation statements)

References 3 publications

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“…If the proposed circuit, however, was applied to a large-sized array, e.g., over 512 × 256 and operating at 200 Hz, accurate data sampling within a pixel-selecting time of nearly 0.04 µs would be needed [20]. As a result, the slow driving speed of the current-programming mechanism from the large line capacitance can prevent the performance of the proposed system [21][22][23][24][25]. In this case, the use of a column digital-to-analog converter (DAC) [26][27][28][29][30], which ensures a pixel-selecting time nearly 510 times longer than that of the single DAC structure, is a suitable solution.…”

Section: Discussionmentioning

confidence: 99%

Nonuniformity-Immune Read-In Integrated Circuit for Infrared Sensor Testing Systems

2020

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In this study, a novel IR projector driver that can minimize nonuniformity in electric circuits, using a dual-current-programming structure, is proposed to generate high-quality infrared (IR) scenes for accurate sensor evaluation. Unlike the conventional current-mode structure, the proposed system reduces pixel-to-pixel nonuniformity by assigning two roles (data sampling and current driving) to a single transistor. A prototype of the proposed circuit was designed and fabricated using the SK-Hynix 0.18 µm CMOS process, and its performance was analyzed using post-layout simulation data. It was verified that nonuniformity, which is defined as the standard deviation divided by the mean radiance, could be reduced from 21% to less than 0.1%.

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Section: Discussionmentioning

confidence: 99%

Nonuniformity-Immune Read-In Integrated Circuit for Infrared Sensor Testing Systems

2020

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“…The resultant array-wide ground-level variations cause RIICs to generate spatially non-uniform driving currents [4]. The variations in the ground voltage are scene-dependent as well; this characteristic poses significant challenges to non-uniformity correction [5]. High-speed IRSPs are typically operated in the snapshot mode, in which all IR emitters in an array emit IR rays synchronously every frame.…”

Section: Introductionmentioning

confidence: 99%

Mismatch-tolerant read-in IC with voltage-drop compensation for infrared scene projectors

Shin

Cho

Lee

2018

IEICE Electron. Express

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This letter presents a mismatch-tolerant read-in integrated circuit (RIIC) with voltage-drop compensation applicable to high-speed and hightemperature infrared scene projectors. A current-programmed unit pixel is designed to compensate for ground-line voltage drops, thus improving the array-wide current uniformity. The proposed mismatch-tolerant design circumvents non-monotonic fluctuations in the output current, irrespective of the matching properties of sampling capacitors and switches. A prototype RIIC with a 32 × 32 unit-pixel array is fabricated in a 0.18-µm CMOS process. The RIIC compensates for voltage drops up to 500 mV with error currents below 1 µA and achieves 10-bit accuracy with output-current nonmonotonicity eliminated.

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“…Few publications are available on long-wave IR (LWIR) light emitting diode (LED) devices [3]. Large-format (512 Â 512) silicon nitride resistor arrays have been used for IR scene projection experiments [4,5]. However, long-term reliability and maximum temperature of emission are still the largest issues for IR resistor technology for HWIL applications [6].…”

Section: Introductionmentioning

confidence: 99%