1980
DOI: 10.1117/12.959353
|View full text |Cite
|
Sign up to set email alerts
|

<title>Preamplifier Noise In Indium Antimonide Detector Systems</title>

Abstract: Voltage noise measurements have been made at temperatures from 77 to 150 K with three JFET's and a preamplifier which closely resembles one used with InSb photovoltaic detectors. Noise minima were detected with the three JFET's at temperatures of 100 -115 K, but the level of voltage noise for two of the three JFET's was found to be below the noise level of InSb detector systems.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

1981
1981
1981
1981

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
references
References 1 publication
0
0
0
Order By: Relevance